摘要
研制了一种输出连续可调的脉冲恒压电源,该电源电压幅度为0～120V,脉宽为3～14μs,触发延迟时间为0～1μs。将其应用于等离子体辐射的软X射线总能量测量系统中,采用脉冲电源和差值法记录信号,通过分析发,实验中测到的电阻变化与电路中其它电阻无关,是X射线辐射导致镍薄膜电阻的变化引起的。测得的镍薄膜电阻的变化为4.47Ω,以此回推计算得Z pinch等离子体源辐射的软X射线能量为63.3kJ。
This paper presents a microsecond pulse power source with adjusted voltage range (0～120V) and regulative pulse duration (3～14μs), which is used in the measurement of the soft X-ray total energy of high power Z-pinch plasma. By the application of microsecond pulse power source and voltage difference recording method and by the analyses of test circuit, the change of resistance in measurement is considered to be result of the Ni-film bolometer change caused by X-ray irradiation.
出处
《强激光与粒子束》
EI
CAS
CSCD
北大核心
2004年第7期947-949,共3页
High Power Laser and Particle Beams
基金
国家自然科学基金重点资助课题(10035020)
