摘要
Yttria-stabilized zirconia (YSZ) thin films with the c-axis texturing were successfully deposited onpolycrystalline metallic tape (Hastelloy-C) by a dc bias rf magnetron sputtering. X-ray measurements re-vealed that the resulting YSZ films exhibited pure c-axis texturing. YBCO films deposited by using demaguetron sputtering on Hastelloy tape with YSZ buffer layer were c-axis oriented with △ω(FWHM of apeak in the rocking curve) = 5. 9° . T_c_o of 91 K and J_c of 2. 0 × 10￣3 A/cm￣2(77 K, OT) were obtained.
Yttria-stabilized zirconia (YSZ) thin films with the c-axis texturing were successfully deposited onpolycrystalline metallic tape (Hastelloy-C) by a dc bias rf magnetron sputtering. X-ray measurements re-vealed that the resulting YSZ films exhibited pure c-axis texturing. YBCO films deposited by using demaguetron sputtering on Hastelloy tape with YSZ buffer layer were c-axis oriented with △ω(FWHM of apeak in the rocking curve) = 5. 9° . T_c_o of 91 K and J_c of 2. 0 × 10￣3 A/cm￣2(77 K, OT) were obtained.
