摘要
提出了一种通过图像处理测量三维空间坐标的新方法。把Ｍ 阵列图案投射到物体上，使Ｍ 阵列各行各列的元素都随时间按Ｍ 系列变化，摄取物体的一幅幅图像，通过求图像上某点的时间序列和基准Ｍ 系列的互相关函数即可确定它和投射点的对应关系，从而求出物体上的点的坐标．这种方法有着良好的抗干扰性．
A new methodology was proposed in determining the shapes and cartesian positions of three-dimensional objects using an optical device setting. An M-array pattern was utilized to arrange the illumination patterns for a matrix of lighting sources on a flat surface. Light emitted from the surface was projected onto the target object through refraction of an optical lense. Guided by the M-array pattern, the on/off of each lighting source in the surface matrix was varied with time. A series of varied images of the sample were obtained as a result of the changes in the lighting surface. By determining the function of the applied M-array sequences with respect to time for a certain glowing point on the surface, a correlation between the target and the glowing point was established. The coordinates of the points on the target object were thus accurately determined. This new method is able to successfully maintain the accuracy by overcoming interferences, e.g., light, brought in from the testing settings.
出处
《陕西科技大学学报（自然科学版）》
1999年第3期15-20,共6页
Journal of Shaanxi University of Science & Technology
关键词
图像处理
位置测量
M阵列
M系列
三维坐标
image processing
positional measurement
M-array
M-series
coordinates in a three-dimensional space
