摘要
为了简化模拟线性电路故障诊断定位阶段的工作量,本文提出了一种确定故障元件存在范围的方法。即在十分现实的 K 故障假设下,去确定能代表电路所有元件并给出在 K 故障假设下的故障诊断议程的唯一解的一组元件——最优可测试元件组,使故障定位工作只局限于该组元件,而不必对电路所有元件进行。从而该方法构成了故障定位的第一步,且与故障定位方法无关。本方法是基于电路的可测试值计算和规范式不确定性组的确定,它在可测试性与不确定性组概念中具有严格的理论基础,其可测试性计算可直接从参数类型故障诊断技术中推得。
In order to simplify the hard work for the fault location in the fault diagnosis of analog linear circuit a procedure is presented for determining the range of fault elements;i.e.by assuming the quite realistic fault hypothesis,the determination is made for a group of elements as the representative of all the circuit dements and a unique solution is given to the fault diagnosis equations.This group is so called as an optimum set of testable elements.Therefore the work for fault location can only be operated in the elements of this group instead of the all circuit elements.So the method constiutes the first step in the development of whatever procedure for the fault loation of analog linear circuits.The proposed procedure is based on the testability evaluation of the circuit and on the determination of the canonical ambiguity groups with its theoretical foundation in the testability concept and in the canonical ambiguity group concept.The testability evaluation can be deduced directly by referring to fault diagnosis techniques of the parametric kind.
出处
《长沙医学院学报》
2005年第1期41-45,共5页
Journal of Changsha Medical University
基金
国家自然科学基金(NO:50277010)
关键词
可测试性
不确定性组
故障定位
参数故障诊断
Testability
ambiguity groups
fault location
Parametric fault diagnosis
