摘要
焦平面红外图像传感器的应用难点之一解决其非均匀性的问题。在论述了两点校正算法原理的基础上 ,提出了一种采用单片机和FPGA实现焦平面红外图像的两点校正的技术途径 ,并给出了其校正增益和偏置系数的计算流程。
One of the key issues of the application of infrared focal plane imaging sensors is the correction of non-uniformity. A new two-point correction method implemented by using MCU and FPGA is proposed. The flow chart of calculation of gain correction and offset coefficient are also given.
出处
《半导体光电》
CAS
CSCD
北大核心
2002年第5期344-346,共3页
Semiconductor Optoelectronics
关键词
焦平面
非均匀性校正
两点校正法
infrared focal plane
non-uniformity correction
two point correction method
