摘要
引入了多学科设计优化(MDO)框架以用于缺陷的红外识别.该计算框架具有良好的开放性和稳定性,由任何不用计算梯度的优化算法如免疫算法、粒子群算法等和通用的CAD建模软件、有限元(FEM)计算软件、数据采集与信号处理软件等组建,使得比较复杂的缺陷参数红外识别问题变得简单、迅速,过程统一.最后给出了约束优化免疫优化算法(COIA)在沉孔型缺陷参数红外识别中一个简单的应用例子.
Multidisciplinary optimization(MDO) is needed for the increasingly complex identification of defect parameters.The MDO computation framework is composed of optimization algorithms of derivative free,CAD/E software,finite element method(FEM) solvers,data acquisition and signal process software,etc.Under this computation framework,the complex defect identification became easy,rapid and unified.An immune algorithm(IA),constrained optimization immune algorithm(COIA) was adopted as an optimization algorithm in t...
出处
《电子器件》
CAS
2007年第5期1684-1688,共5页
Chinese Journal of Electron Devices
基金
总装"十一.五"装备维修改革基金项目资助(KY38010914)
