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铂粉物理特性对厚膜铂电阻温度系数的影响 被引量:3

Effect of Performance of Platinum Powder on TCR of Thick Film Platinum Resistance
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摘要 采用化学还原方法制备3种超细铂粉, 通过对铂粉物理特性的测试和微观结构分析, 解释了引起电阻温度系数(TCR)变化的原因. 发现粒度分布为0.1~0.6 μm, 比表面积1.45 m2·g-1, 松装密度0.85 g·cm-3, 表面光滑的2#球形铂粉,用于制作厚膜铂电阻温度传感器生产工艺可行,电阻温度系数达到380×106·℃-1,是一种理想的电阻材料. Three different superfine platinum powders were prepared by chemical reduction method. The physical characteristics of the platinum powder was measured. Through analyzing the microstructure of the platinum powder, the change of TCR value was explained. It is found that the platinum powder, marked with 2#, is spherical with smooth surface. Its size distribution is 0.1~0.6 μm. The specific surface is 1.45 m2·g(-1) and the apparent density is 0.85 (g·cm(-3)). It is suitable to manufacture thick film platinum r...
出处 《稀有金属》 EI CAS CSCD 北大核心 2005年第4期465-467,共3页 Chinese Journal of Rare Metals
关键词 铂粉 厚膜铂电阻 温度系数 platinum powder thick film platinum resistance TCR
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  • 1[1]Yu Shougeng, Zhang Xiaomin, Liu Enuo. Proceedings of the fifteenth international precious metals conference and exhibition [C]. Naples, Florida, 1991. 283. 被引量:1
  • 2[2]Yu Shougeng, Zhang Xiaomin, Liu Enuo. Proceedings of international conference on electronic components and materials/sensors and actuators [C]. October 5-8, 1995. 368 被引量:1
  • 3韦群燕,李向群,俞守耕.银粉特性对银膜致密性的影响[J].贵金属,2001,22(3):35-38. 被引量:6

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