摘要
模拟开关因具有功耗低、速度快、无机械触点、体积小和使用寿命长等特点,广泛应用于各类电子设备中,完成信号链路中的信号切换功能。某型号双路单刀双掷模拟开关在使用过程中出现功能异常,表现为第三路开关无法正常导通。本文详细介绍了分析的过程,进行了静电应力、过电应力的外部原因分析及电路自身质量问题分析,定位故障原因为工艺加工缺陷引起的氧化层耐压能力降低,氧化层被击穿导致电路异常。文章阐述了故障机理,并对工艺加工过程、筛选试验提出了建议,分析结论对后续类似电路的生产制造具有一定的借鉴意义。
Analog switches are often used in various electrical equipment to complete a signal switch function in signal chains.These switches are low-power,high-speed,mechanical contact free,small and long-durable.In the terms of use,some function abnormal occurred in one kind of dual SPDT analog switches which third channel can not connect as usual.In this paper,the process of analysis is fully introduced which include ESD analysis,over-power analysis and self-quality analysis.Through the failure analysis method,the failure is located at oxide layer breakdown due to the withstand voltage goes down of the oxide layer because of foundry production defect.The paper elaborates the failure mechanism and declares some suggestions to foundry production process and screening.At the same time,the conclusion of this paper is a reference for similar circuit production forward.
作者
杭丽
刘文喆
霍改青
HANG Li;LIU Wen-zhe;HUO Gai-qing(Sichuan Institute of Solid-State Circuits,China Electronics Technology Group Corp.,Chongqing 400060)
出处
《环境技术》
2021年第S01期71-74,92,共5页
Environmental Technology
关键词
模拟开关
工艺加工缺陷
氧化层
击穿
analog switches
foundry production defect
oxide layer
breakdown
