摘要
该文介绍多层陶瓷电容(MLCC)的基本结构,运用高温存储试验和高温工作试验,模拟实际使用过程中的高温应力和电应力的作用,研究不同规格MLCC性能退化情况及失效原因分析。
The basic structure of Multi-layer Ceramic Capacitors(MLCC)is introduced.The high temperature storage test and high temperature working test are used to simulate the effect of high temperature stress and electrical stress in the process of actual operation,and the performance degradation and failure reason analysis of different specifications of MLCC are studied.
作者
丁林祥
李越欢
张佳萍
刘晓臣
刘兰兰
DING Linxiang;LI Yuehuan;ZHANG Jiaping;LIU Xiaochen;LIU Lanlan(The Fifth Electronic Research Institute of MIIT,Guangzhou 510610,China;GuangDong FengHua Advanced Technology Holding Lo.,Ltd.,Zhaoqing 526020,China)
出处
《中国测试》
CAS
北大核心
2020年第S02期137-139,共3页
China Measurement & Test
基金
广东省重点领域研发计划资助(2019B040403004)
关键词
温度应力
电应力
容量
损耗角正切
失效
temperature stress
electric stress
capacity
loss tangent
failure