The rates of 14 N/ 12 /C in wheat seeds wene measured by using 14 N( d,p ) 15 N and 12 C( d,p) 13 C reactions induced by 13.4MeV deuterons which wene produced by a cylotron.According to the measured 14 N/ 12 C rates,t...The rates of 14 N/ 12 /C in wheat seeds wene measured by using 14 N( d,p ) 15 N and 12 C( d,p) 13 C reactions induced by 13.4MeV deuterons which wene produced by a cylotron.According to the measured 14 N/ 12 C rates,the relative protein contents in different wheat sorts were defermined and compared with the results obtained by the Kjeldahl method.展开更多
文摘The rates of 14 N/ 12 /C in wheat seeds wene measured by using 14 N( d,p ) 15 N and 12 C( d,p) 13 C reactions induced by 13.4MeV deuterons which wene produced by a cylotron.According to the measured 14 N/ 12 C rates,the relative protein contents in different wheat sorts were defermined and compared with the results obtained by the Kjeldahl method.
文摘本文介绍的动态离子束混合技术制备氧化铬薄膜系在不锈钢基体上进行1keV氩离子束溅射沉积铬(同时通入一定量的O),并用100keV的氩离子束或氧离子束轰击该样品。对两种离子束轰击形成的氧化铬薄膜进行了X射线光电子能谱(X-ray photoelectron spectroscopy,XPS)和俄歇电子能谱(Auger electron spectroscopy,AES)的分析研究。发现Ar+离子束制备的氧化铬薄膜主要是Cr2O3化合物,而O+离子束制备的氧化铬薄膜含有其它价态的铬氧化物。Ar+离子束制备氧化铬薄膜的污染碳少于O+离子束制备。与O+离子束制备相比较,相同能量的Ar+离子束轰击更有利于提高沉积的Cr原子与周围O2的反应性;Ar+离子束制备的氧化铬薄膜过渡层的厚1/3左右,较厚的过渡层显示了制备的薄膜具有较好的附着力。
