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基于正交试验的慢走丝电火花线切割加工的参数优化 被引量:22
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作者 边留进 林子超 +1 位作者 孙方宏 郭松寿 《现代制造工程》 CSCD 北大核心 2013年第10期1-5,93,共6页
慢走丝电火花线切割作为一种重要的加工方式,广泛应用于高精度硬质合金模具的加工领域。材料去除率与表面粗糙度是电火花线切割加工中最重要的两项指标。通过正交试验法,研究了加工硬质合金模具时,慢走丝电火花线切割的加工参数(电流峰... 慢走丝电火花线切割作为一种重要的加工方式,广泛应用于高精度硬质合金模具的加工领域。材料去除率与表面粗糙度是电火花线切割加工中最重要的两项指标。通过正交试验法,研究了加工硬质合金模具时,慢走丝电火花线切割的加工参数(电流峰值、放电脉宽时间、脉间时间、主电源电压、伺服电压和电解质水压力)对上述两项性能指标的影响,分析了影响性能指标的主次因素,并得到了最佳的参数配置。最后,在慢走丝电火花线切割机床上验证了所得到的优化参数是可行的。 展开更多
关键词 慢走丝电火花线切割 正交试验 材料去除率 表面粗糙度 参数优化
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Si-doped diamond films prepared by chemical vapour deposition 被引量:1
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作者 崔雨潇 张建国 +1 位作者 孙方宏 张志明 《Transactions of Nonferrous Metals Society of China》 SCIE EI CAS CSCD 2013年第10期2962-2970,共9页
The effects of Si doping on morphology, components and structure characteristics of CVD diamond films were studied. Si-doped CVD diamond films were deposited on Si substrate by adding tetraethoxysilane (TEOS) into a... The effects of Si doping on morphology, components and structure characteristics of CVD diamond films were studied. Si-doped CVD diamond films were deposited on Si substrate by adding tetraethoxysilane (TEOS) into acetone as source of reactant gas. The morphology and microstructure of diamond films were characterized by scanning electron microcopy (SEM). The crystalline quality of diamond films was studied by Raman spectroscopy and X-ray diffractometry (XRD). The surface roughness of the films was evaluated with surface profilometer. The results suggest that Si doping tends to reduce the crystallite size, enhance grain refinement and inhibit the appearance of (11 I) facets. Raman spectra indicate that Si doping can enhance the formation of sp2 phase in diamond films. Moreover, Raman signal of SiC was detected, which suggests the existence of Si in the diamond films. Smooth fine-grained diamond (SFGD) film was synthesized at Si to C ratio of 1%. 展开更多
关键词 Si doping hot filament chemical vapor deposition (HFCVD) diamond films
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