Both green and residual bending strength of the dip-coat layer composed of ZrO2 (CaO) powder and colloi-dal zirconiz sol binder are sutdied and the effects of process factrs on the strength of dip-coat layer are inter...Both green and residual bending strength of the dip-coat layer composed of ZrO2 (CaO) powder and colloi-dal zirconiz sol binder are sutdied and the effects of process factrs on the strength of dip-coat layer are interpreted,using the results of TG-DTA ,TMA and SEM analyses of the fracture morphology of the coating layer and following the strength theory for porous body.展开更多
The (h00) oriented YSZ (yttria-stabilized zirconia) buffer layers were grown successfully on (1120) and(1102) sapphire plane substrates by rf. planar target magnetron sputtering method. The effect of different dep-os...The (h00) oriented YSZ (yttria-stabilized zirconia) buffer layers were grown successfully on (1120) and(1102) sapphire plane substrates by rf. planar target magnetron sputtering method. The effect of different dep-osition conditions on the structure of YSZ films was studied X-ray diffraction rock curve and electron channel-ling pattern (ECP) showed that the YSZ films has highly oriented nature. YBCO (Y BaCuO) films were depos-ited on the YSZ / (1120) Al_2O_3 and (1102) Al_2O_3, substrate by in situ de inverted cyhdrical target magnetronsputtering method. T_c≥88K and J_c=1O × 10￣6A / cm￣2 at 77 K were achieved展开更多
文摘Both green and residual bending strength of the dip-coat layer composed of ZrO2 (CaO) powder and colloi-dal zirconiz sol binder are sutdied and the effects of process factrs on the strength of dip-coat layer are interpreted,using the results of TG-DTA ,TMA and SEM analyses of the fracture morphology of the coating layer and following the strength theory for porous body.
文摘The (h00) oriented YSZ (yttria-stabilized zirconia) buffer layers were grown successfully on (1120) and(1102) sapphire plane substrates by rf. planar target magnetron sputtering method. The effect of different dep-osition conditions on the structure of YSZ films was studied X-ray diffraction rock curve and electron channel-ling pattern (ECP) showed that the YSZ films has highly oriented nature. YBCO (Y BaCuO) films were depos-ited on the YSZ / (1120) Al_2O_3 and (1102) Al_2O_3, substrate by in situ de inverted cyhdrical target magnetronsputtering method. T_c≥88K and J_c=1O × 10￣6A / cm￣2 at 77 K were achieved
