Multiseed (msd) mutant sorghum [Sorghum bicolor (L.) Moench] lines with greatly increased seed numbers were developed. It was originally thought that the msd trait could increase grain yield several times in compariso...Multiseed (msd) mutant sorghum [Sorghum bicolor (L.) Moench] lines with greatly increased seed numbers were developed. It was originally thought that the msd trait could increase grain yield several times in comparison with the wild type from which the mutant was derived. However, in a small plot trial, msd seed yield decreased when compared to the parent line. Herein we report results that msd seed yield remained either unchanged or slightly increased in comparison to the parent line. We suggest that attempts to measure msd sorghum seed yield were complicated due to systematic errors associated with the post-harvest processing methods, including threshing and pneumatic winnowing equipment that was used for harvest. That is, seed recovery and seed loss from individual panicles were affected by the post-harvest processing. When evaluating sorghum grain yield of types with different seed sizes, threshing and seed cleaning harvesting methods should be optimized for each sorghum line.展开更多
Purpose The limitation of the traditional bias neutralization method is proved,and a new neutralization method is proposed to measure the secondary electron yield of insulating materials.Method While measuring the sec...Purpose The limitation of the traditional bias neutralization method is proved,and a new neutralization method is proposed to measure the secondary electron yield of insulating materials.Method While measuring the secondary electron yield of an insulating sample using the bias neutralization method,the region of an insulating sample irradiated by an electron beam may not be neutralized,because electrons enforced by the bias are not returned to the proper location.The above-mentioned phenomenon is verified by a simulation.To achieve proper neutralization,we propose a method of moving the electron beam to irradiate the metal sample stage without applying a bias voltage,which generates many low-energy electrons around the insulating sample.Those electrons are automatically attracted to the positively charged region of the insulating sample surface and rejected if enough electrons accumulated on the surface.Result and conclusion The limitation of neutralization of bias voltage was verified by simulation,and the new neutralization method was proved to be effective through experiments.展开更多
文摘Multiseed (msd) mutant sorghum [Sorghum bicolor (L.) Moench] lines with greatly increased seed numbers were developed. It was originally thought that the msd trait could increase grain yield several times in comparison with the wild type from which the mutant was derived. However, in a small plot trial, msd seed yield decreased when compared to the parent line. Herein we report results that msd seed yield remained either unchanged or slightly increased in comparison to the parent line. We suggest that attempts to measure msd sorghum seed yield were complicated due to systematic errors associated with the post-harvest processing methods, including threshing and pneumatic winnowing equipment that was used for harvest. That is, seed recovery and seed loss from individual panicles were affected by the post-harvest processing. When evaluating sorghum grain yield of types with different seed sizes, threshing and seed cleaning harvesting methods should be optimized for each sorghum line.
基金supported by the National Natural Science Foundation of China(Grant Nos.11535014,11675278 and 11975017)the State Key Laboratory of Par-ticle Detection and Electronics(SKL.PDE-ZZ-201920)the National Key Research and Development Project of China(2016YFFO100402).
文摘Purpose The limitation of the traditional bias neutralization method is proved,and a new neutralization method is proposed to measure the secondary electron yield of insulating materials.Method While measuring the secondary electron yield of an insulating sample using the bias neutralization method,the region of an insulating sample irradiated by an electron beam may not be neutralized,because electrons enforced by the bias are not returned to the proper location.The above-mentioned phenomenon is verified by a simulation.To achieve proper neutralization,we propose a method of moving the electron beam to irradiate the metal sample stage without applying a bias voltage,which generates many low-energy electrons around the insulating sample.Those electrons are automatically attracted to the positively charged region of the insulating sample surface and rejected if enough electrons accumulated on the surface.Result and conclusion The limitation of neutralization of bias voltage was verified by simulation,and the new neutralization method was proved to be effective through experiments.
