We report a method to tune the second harmonic generation(SHG) frequency of a metallic octamer by employing cylindrical vector beams as the excitation. Our method exploits the ability to spatially match the polarizati...We report a method to tune the second harmonic generation(SHG) frequency of a metallic octamer by employing cylindrical vector beams as the excitation. Our method exploits the ability to spatially match the polarization state of excitations with the fundamental target plasmonic modes, enabling flexible control of the SHG resonant frequency.It is found that SHG of the octamer is enhanced over a broad band(400 nm) by changing the excitation from the linearly polarized Gaussian beam to radially and azimuthally polarized beams. More strikingly, when subjected to an azimuthally polarized beam, the SHG intensity of the octamer becomes 30 times stronger than that for the linearly polarized beam even in the presence of Fano resonance.展开更多
This paper presents a novel approach of obstacle avoidance for redundant manipulators, which is challenging with the considerations of the building of universal kinematics, the formation of dynamics, and the generatio...This paper presents a novel approach of obstacle avoidance for redundant manipulators, which is challenging with the considerations of the building of universal kinematics, the formation of dynamics, and the generation of trajectories. A universal approach to deal with obstacle avoidance for the redundant manipulator, that is based on the configuration plane, is presented. The paper also examines common serial robot configurations and introduces a method for classification, partitioning, simplification, and forms of expression used in the workspace to define the configuration plane. This relatively new method is combined with a weighted space vector method to match the configuration plane and solve the inverse kinematics problem. The proposed planner is demonstrated with examples, in which the proposed planner is shown to be capable of providing a smoother trajectory.展开更多
Coverage evaluation is indispensable for verification via simulation. As the functional complexity of modern design is increasing at a breathtaking pace, it is requisite to take observability into account. Unfortunate...Coverage evaluation is indispensable for verification via simulation. As the functional complexity of modern design is increasing at a breathtaking pace, it is requisite to take observability into account. Unfortunately, nowadays coverage metrics taking observability into account are not very satisfactory. On the one hand, for the observability assessment algorithms proposed up to now, the overhead of computing is large, so they could not be integrated into simulation tools easily. On the other hand, the vector generation methods involving the metrics taking observability into account are not very efficient, and there exists a disconnection between these metrics and the vector generation process. In this paper, some original ideas for the problems above are presented. （1） Precise and concise abstract representations from HDL （Hardware Description Language） descriptions at RTL （Register Transfer Level） are presented to model observability information. （2） A novel observability evaluation method based on the proposed models is introduced. This method is more computationally efficient than prior efforts to assess observability and it could be integrated into compilers and simulators easily. （3） A new simulation vector generation procedure involving the observability-enhanced statement coverage metric is developed. The method is simulation：based and driven by the distribution of unobserved statements. During this procedure, the proposed algorithm always tries to cover all unobserved statements, and reduce unnecessary backtracking, so it is efficient. The methods proposed have been implemented as a prototype tool for VHDL designs, and the results on benchmarks show significant benefits.展开更多
As the complexity of nanocircuits continues to increase,developing tests for them becomes more difficult.Failure analysis and the localization of internal test points within nanocircuits are already more difficult tha...As the complexity of nanocircuits continues to increase,developing tests for them becomes more difficult.Failure analysis and the localization of internal test points within nanocircuits are already more difficult than for conventional integrated circuits.In this paper,a new method of testing for faults in nanocircuits is presented that uses single-photon detection to locate failed components(or failed signal lines)by utilizing the infrared photon emission characteristics of circuits.The emitted photons,which can carry information about circuit structure,can aid the understanding of circuit properties and locating faults.In this paper,in order to enhance the strength of emitted photons from circuit components,test vectors are designed for circuits’components or signal lines.These test vectors can cause components to produce signal transitions or switching behaviors according to their positions,thereby increasing the strength of the emitted photons.A multiple-valued decision diagram(MDD),in the form of a directed acrylic graph,is used to produce the test vectors.After an MDD corresponding to a circuit is constructed,the test vectors are generated by searching for specific paths in the MDD of that circuit.Experimental results show that many types of faults such as stuck-at faults,bridging faults,crosstalk faults,and others,can be detected with this method.展开更多
基金National Key R&D Program of China(2017YFA0303800)National Natural Science Foundation of China(NSFC)(11634010,51777168,61377035,61675170,61675171,61701303)+4 种基金Australian Research Council(ARC)(DP140100883)Natural Science Basic Research Plan in Shaanxi Province,China(2017JM6022)Fundamental Research Funds for the Central Universities,China(3102017zy017)Natural Science Foundation of Shanghai,China(17ZR1414300)Shanghai Pujiang Program,China(17PJ1404100)
文摘We report a method to tune the second harmonic generation(SHG) frequency of a metallic octamer by employing cylindrical vector beams as the excitation. Our method exploits the ability to spatially match the polarization state of excitations with the fundamental target plasmonic modes, enabling flexible control of the SHG resonant frequency.It is found that SHG of the octamer is enhanced over a broad band(400 nm) by changing the excitation from the linearly polarized Gaussian beam to radially and azimuthally polarized beams. More strikingly, when subjected to an azimuthally polarized beam, the SHG intensity of the octamer becomes 30 times stronger than that for the linearly polarized beam even in the presence of Fano resonance.
基金Supported by the Natural Science Foundation of Heilongjiang Province(E2017024)the 13th Five-Year Naval Research(J040717005)National Defense Basic Research(A0420132202)
文摘This paper presents a novel approach of obstacle avoidance for redundant manipulators, which is challenging with the considerations of the building of universal kinematics, the formation of dynamics, and the generation of trajectories. A universal approach to deal with obstacle avoidance for the redundant manipulator, that is based on the configuration plane, is presented. The paper also examines common serial robot configurations and introduces a method for classification, partitioning, simplification, and forms of expression used in the workspace to define the configuration plane. This relatively new method is combined with a weighted space vector method to match the configuration plane and solve the inverse kinematics problem. The proposed planner is demonstrated with examples, in which the proposed planner is shown to be capable of providing a smoother trajectory.
文摘Coverage evaluation is indispensable for verification via simulation. As the functional complexity of modern design is increasing at a breathtaking pace, it is requisite to take observability into account. Unfortunately, nowadays coverage metrics taking observability into account are not very satisfactory. On the one hand, for the observability assessment algorithms proposed up to now, the overhead of computing is large, so they could not be integrated into simulation tools easily. On the other hand, the vector generation methods involving the metrics taking observability into account are not very efficient, and there exists a disconnection between these metrics and the vector generation process. In this paper, some original ideas for the problems above are presented. （1） Precise and concise abstract representations from HDL （Hardware Description Language） descriptions at RTL （Register Transfer Level） are presented to model observability information. （2） A novel observability evaluation method based on the proposed models is introduced. This method is more computationally efficient than prior efforts to assess observability and it could be integrated into compilers and simulators easily. （3） A new simulation vector generation procedure involving the observability-enhanced statement coverage metric is developed. The method is simulation：based and driven by the distribution of unobserved statements. During this procedure, the proposed algorithm always tries to cover all unobserved statements, and reduce unnecessary backtracking, so it is efficient. The methods proposed have been implemented as a prototype tool for VHDL designs, and the results on benchmarks show significant benefits.
文摘使用基于模型的开发流程设计无速度传感器异步电机矢量控制器。在M atlab/S imu link中进行系统级设计,对速度控制模块、前馈解耦PI电流控制模块、自适应磁链观测器等控制器模块进行建模并整合仿真。模型验证无误后,加入C281x芯片支持模块,利用Real-Tim e W orkshop从S imu link模型生成DSP的C语言程序。程序的正确性在DSP目标板上得到了验证。
基金supported by the National Natural Science Foundation of China(Grant No.61072028)the Project of the Department of Education of Guangdong Province(Grant No.2012KJCX0040)the Guangdong Province and Chinese Ministry of Education Cooperation Project of Industry,Education,and Academy(Grant No.2009B090300339)
文摘As the complexity of nanocircuits continues to increase,developing tests for them becomes more difficult.Failure analysis and the localization of internal test points within nanocircuits are already more difficult than for conventional integrated circuits.In this paper,a new method of testing for faults in nanocircuits is presented that uses single-photon detection to locate failed components(or failed signal lines)by utilizing the infrared photon emission characteristics of circuits.The emitted photons,which can carry information about circuit structure,can aid the understanding of circuit properties and locating faults.In this paper,in order to enhance the strength of emitted photons from circuit components,test vectors are designed for circuits’components or signal lines.These test vectors can cause components to produce signal transitions or switching behaviors according to their positions,thereby increasing the strength of the emitted photons.A multiple-valued decision diagram(MDD),in the form of a directed acrylic graph,is used to produce the test vectors.After an MDD corresponding to a circuit is constructed,the test vectors are generated by searching for specific paths in the MDD of that circuit.Experimental results show that many types of faults such as stuck-at faults,bridging faults,crosstalk faults,and others,can be detected with this method.
