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Surface Recombination Concept as Applied to Determinate Silicon Solar Cell Base Optimum Thickness with Doping Level Effect 被引量:2
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作者 Masse Samba Diop Hamet Yoro Ba +6 位作者 Ndeye Thiam Ibrahima Diatta Youssou Traore Mamadou Lamine Ba El Hadji Sow Oulymata Mballo Grégoire Sissoko 《World Journal of Condensed Matter Physics》 2019年第4期102-111,共10页
New expressions of back surface recombination of excess minority carriers in the base of silicon solar are expressed dependent on both, the thickness and the diffusion coefficient which is in relationship with the dop... New expressions of back surface recombination of excess minority carriers in the base of silicon solar are expressed dependent on both, the thickness and the diffusion coefficient which is in relationship with the doping rate. The optimum thickness thus obtained from the base of the solar cell allows the saving of the amount of material needed in its manufacture without reducing its efficiency. 展开更多
关键词 Silicon Solar Cell surface recombination VELOCITY DIFFUSION COEFFICIENT DOPING rate BASE Thickness
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PEALD制备的Al_(2)O_(3)薄膜在n-TOPCon太阳电池上的钝化性能 被引量:1
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作者 于波 史金超 +4 位作者 李锋 王红芳 陈俊玉 刘克铭 于威 《半导体技术》 CAS 北大核心 2021年第5期370-375,共6页
对采用等离子体增强原子层沉积(PEALD)法制备的Al_(2)O_(3)薄膜在n型单晶硅隧穿氧化层钝化接触(TOPCon)太阳电池正表面的钝化性能进行了研究。采用少数载流子寿命、X射线电子能谱(XPS)及J-V特性的测试分析,重点研究了Al_(2)O_(3)沉积温... 对采用等离子体增强原子层沉积(PEALD)法制备的Al_(2)O_(3)薄膜在n型单晶硅隧穿氧化层钝化接触(TOPCon)太阳电池正表面的钝化性能进行了研究。采用少数载流子寿命、X射线电子能谱(XPS)及J-V特性的测试分析,重点研究了Al_(2)O_(3)沉积温度、薄膜厚度及薄膜形成后不同退火条件对钝化性能的影响,实现了低表面复合速率、良好钝化效果的产业化制备的Al_(2)O_(3)薄膜工艺。研究结果表明,在沉积温度为150℃、膜厚为5 nm、退火温度为450℃时,测试计算得出薄膜中O和Al的原子数之比为2.08,电池发射极正表面复合速率较低,达到了Al_(2)O_(3)钝化的最优效果,并且分析了Al_(2)O_(3)薄膜的化学态和形成机理。利用其Al_(2)O_(3)薄膜工艺制备的n型单晶硅TOPCon太阳电池开路电压提升了8 mV,电池的平均光电转换效率达到了23.30%。 展开更多
关键词 隧穿氧化层钝化接触(TOPCon)太阳电池 表面复合速率 钝化 退火 Al_(2)O_(3)
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Theoretical investigation of some parameters into the behavior of quantum dot solar cells
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作者 A.Nasr A.Aly 《Journal of Semiconductors》 EI CAS CSCD 2014年第12期13-20,共8页
The main goal of this paper is to determine the accurate values of two parameters namely the surface generation–recombination rate and the average total number of electrons density generated in the i-region. These va... The main goal of this paper is to determine the accurate values of two parameters namely the surface generation–recombination rate and the average total number of electrons density generated in the i-region. These values will enhance the performance of quantum dot solar cells(QDSCs). In order to determine these values, this paper concentrates on the optical generation lifetime, the recombination lifetime, and the effective density state in QDs. Furthermore, these parameters are studied in relation with the average total number of electrons density. The values of the surface generation–recombination rate are found to be negative, which implies that the generation process is dominant in the absorption quantum dot region. Consequently, induced photocurrent density relation with device parameters is determined. The results ensure that QDSCs can have higher response photocurrent and then improve the power conversion efficiency. Moreover, the peak value of the average total number of electrons density is achieved at the UV range and is extended to the visible range, which is adequate for space and ground solar applications. 展开更多
关键词 surface generation recombination rate quantum dot solar cells optical generation and recombination lifetimes dot density power conversion efficiency
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