Organic semiconductor single crystals(OSSCs) have shown their promising potential in high-performance organic field-effect transistors(OFETs). The interfacial dielectric layers are critical in these OFETs as they not ...Organic semiconductor single crystals(OSSCs) have shown their promising potential in high-performance organic field-effect transistors(OFETs). The interfacial dielectric layers are critical in these OFETs as they not only govern the key semiconductor/dielectric interface quality but also determine the growth of OSSCs by their wetting properties. However, reported interfacial dielectric layers either need rigorous preparation processes, rely on certain surface chemistry reactions, or exhibit poor solvent resistance, which limits their applications in low-cost, large-area, monolithic fabrication of OSSC-based OFETs. In this work, polyethylene(PE) thin films and lamellar single crystals are utilized as the interfacial dielectric layers, providing solvent resistive but wettable surfaces that facilitate the crystallization of 6,13-bis(tri-isopropylsilylethynyl)pentacene(TIPS-PEN) and 6,13-bis(triisopropylsilylethynyl)-5,7,12,14-tetraazapentacene(TIPS-TAP). As evidenced by the presence of ambipolar behavior in TIPS-PEN single crystals and the high electron mobility(2.3 ± 0.34 cm^(2)V^(-1)s^(-1)) in TIPS-TAP single crystals, a general improvement on electron transport with PE interfacial dielectric layers is revealed, which likely associates with the chemically inertness of the saturated C-H bonds. With the advantages in both processing and device operation, the PE interfacial dielectric layer potentially offers a monolithic way for the enhancement of electron transport in solution-processed OSSC-based OFETs.展开更多
The effect of freezing layer on the crystallization kinetics of poly(ε-caprolactone)(PCL)thin and ultrathin films was investigated by monitor the growth process of it on oriented polyethylene(PE)and CaF_(2)with and w...The effect of freezing layer on the crystallization kinetics of poly(ε-caprolactone)(PCL)thin and ultrathin films was investigated by monitor the growth process of it on oriented polyethylene(PE)and CaF_(2)with and without freezing layer,respectively.It was found that the PCL films with similar thicknesses crystallize much faster on oriented PE than on CaF_(2)substrate.For example,the crystallization rate constant of a 102 nm thick PCL film decreases tremendously by 3 orders of magnitude from 1.1×10^(-1) on PE substrate at 50℃to 7×10^(-4)on CaF_(2)surface at 40℃.Moreover,the crystallization of PCL accelerates on CaF_(2)surface while slows down at PE surface with increasing film thickness.The ultrathin films of PCL with thickness less than 14 nm exhibits the fastest crystallization rate on oriented PE with a rate constant of about 3.5×10^(-1),which is 3 times higher than that of a ca.50 nm thick film.This illustrates the great influence of freezing layer on the crystallization process of PCL.The freezing layer thickness of PCL on PE is estimated to be in the range of 14-17 nm.Taking the radius of gyration(R_(g)~15.6 nm)of the used PCL material into account,the obtained results may imply the existence of a correlation between the R_(g)of PCL and its freezing layer thickness at PE substrate.展开更多
Mesoporous polyethylene glycol-resorcinol and formaldehyde（PEG-RF） carbon xerogels were prepared by a new polymer blend method in which PEG-RF mixed organic xerogels were synthesized by blending thermally unstable p...Mesoporous polyethylene glycol-resorcinol and formaldehyde（PEG-RF） carbon xerogels were prepared by a new polymer blend method in which PEG-RF mixed organic xerogels were synthesized by blending thermally unstable polyethylene glycol with organic monomers, resorcinol and formaldehyde and then subjected to pyrolization at 1 000 ℃. The influences of mass ratio of PEG to the theoretical yield of RF xerogel, m（PEG）/m（RF） and the （relative） molecular mass of PEG on the pore structure and electric double layer capacitance（EDLC） performance of PEG-RF carbon xerogels were investigated. The results show that PEG under different conditions leads to the difference of phase separation structure of the polymer blend and thus the change of pore structure of PEG-RF carbon xerogels. Specific surface area and capacity of PEG-RF carbon xerogels in 30% H2SO4 solution can reach （755 m2/g） and 150 F/g, respectively. Their surface can be fully utilized to form electric double layer. However, the pore structure differences of PEG-RF carbon xerogels result in their different EDLC performances. The distributed capacitance effect increases with decreasing the pore size of PEG-RF carbon xerogels.展开更多
基金supported by the National Key Research and Development Program of China (Nos.2019YFE0116700,2019YFA0705900) funded by MOSTNational Natural Science Foundation of China (Nos.51873182, 52103231)+2 种基金Zhejiang Province Science and Technology Plan (No.2021C04012) funded by Zhejiang Provincial Department of Science and TechnologyShanxiZheda Institute of Advanced Materials and Chemical Engineering(No.2021SZ-FR003)the support by the Fundamental Research Funds for the Central Universities (No.226-2023-00113)。
文摘Organic semiconductor single crystals(OSSCs) have shown their promising potential in high-performance organic field-effect transistors(OFETs). The interfacial dielectric layers are critical in these OFETs as they not only govern the key semiconductor/dielectric interface quality but also determine the growth of OSSCs by their wetting properties. However, reported interfacial dielectric layers either need rigorous preparation processes, rely on certain surface chemistry reactions, or exhibit poor solvent resistance, which limits their applications in low-cost, large-area, monolithic fabrication of OSSC-based OFETs. In this work, polyethylene(PE) thin films and lamellar single crystals are utilized as the interfacial dielectric layers, providing solvent resistive but wettable surfaces that facilitate the crystallization of 6,13-bis(tri-isopropylsilylethynyl)pentacene(TIPS-PEN) and 6,13-bis(triisopropylsilylethynyl)-5,7,12,14-tetraazapentacene(TIPS-TAP). As evidenced by the presence of ambipolar behavior in TIPS-PEN single crystals and the high electron mobility(2.3 ± 0.34 cm^(2)V^(-1)s^(-1)) in TIPS-TAP single crystals, a general improvement on electron transport with PE interfacial dielectric layers is revealed, which likely associates with the chemically inertness of the saturated C-H bonds. With the advantages in both processing and device operation, the PE interfacial dielectric layer potentially offers a monolithic way for the enhancement of electron transport in solution-processed OSSC-based OFETs.
基金financially supported by the National Natural Science Foundation of China(Nos.52103017 and 52027804)。
文摘The effect of freezing layer on the crystallization kinetics of poly(ε-caprolactone)(PCL)thin and ultrathin films was investigated by monitor the growth process of it on oriented polyethylene(PE)and CaF_(2)with and without freezing layer,respectively.It was found that the PCL films with similar thicknesses crystallize much faster on oriented PE than on CaF_(2)substrate.For example,the crystallization rate constant of a 102 nm thick PCL film decreases tremendously by 3 orders of magnitude from 1.1×10^(-1) on PE substrate at 50℃to 7×10^(-4)on CaF_(2)surface at 40℃.Moreover,the crystallization of PCL accelerates on CaF_(2)surface while slows down at PE surface with increasing film thickness.The ultrathin films of PCL with thickness less than 14 nm exhibits the fastest crystallization rate on oriented PE with a rate constant of about 3.5×10^(-1),which is 3 times higher than that of a ca.50 nm thick film.This illustrates the great influence of freezing layer on the crystallization process of PCL.The freezing layer thickness of PCL on PE is estimated to be in the range of 14-17 nm.Taking the radius of gyration(R_(g)~15.6 nm)of the used PCL material into account,the obtained results may imply the existence of a correlation between the R_(g)of PCL and its freezing layer thickness at PE substrate.
文摘Mesoporous polyethylene glycol-resorcinol and formaldehyde（PEG-RF） carbon xerogels were prepared by a new polymer blend method in which PEG-RF mixed organic xerogels were synthesized by blending thermally unstable polyethylene glycol with organic monomers, resorcinol and formaldehyde and then subjected to pyrolization at 1 000 ℃. The influences of mass ratio of PEG to the theoretical yield of RF xerogel, m（PEG）/m（RF） and the （relative） molecular mass of PEG on the pore structure and electric double layer capacitance（EDLC） performance of PEG-RF carbon xerogels were investigated. The results show that PEG under different conditions leads to the difference of phase separation structure of the polymer blend and thus the change of pore structure of PEG-RF carbon xerogels. Specific surface area and capacity of PEG-RF carbon xerogels in 30% H2SO4 solution can reach （755 m2/g） and 150 F/g, respectively. Their surface can be fully utilized to form electric double layer. However, the pore structure differences of PEG-RF carbon xerogels result in their different EDLC performances. The distributed capacitance effect increases with decreasing the pore size of PEG-RF carbon xerogels.
