Degradation and overstress failures occur in many electronic systems in which the operation load and environmental conditions are complex.The dependency of them called dependent competing failure process(DCFP),has bee...Degradation and overstress failures occur in many electronic systems in which the operation load and environmental conditions are complex.The dependency of them called dependent competing failure process(DCFP),has been widely studied.Electronic system may experience mutual effects of degradation and shocks,they are considered to be interdependent.Both the degradation and the shock processes will decrease the limit of system and cause cumulative effect.Finally,the competition of hard and soft failure will cause the system failure.Based on the failure mechanism accumulation theory,this paper constructs the shock-degradation acceleration and the threshold descent model,and a system reliability model established by using these two models.The mutually DCFP effect of electronic system interaction has been decomposed into physical correlation of failure,including acceleration,accumulation and competition.As a case,a reliability of electronic system in aeronautical system has been analyzed with the proposed method.The method proposed is based on failure physical evaluation,and could provide important reference for quantitative evaluation and design improvement of the newly designed system in case of data deficiency.展开更多
The degradation data of multi-components in missile is derived by periodical testing. How to use these data to assess the storage reliability (SR) of the whole missile is a difficult problem in current research. An SR...The degradation data of multi-components in missile is derived by periodical testing. How to use these data to assess the storage reliability (SR) of the whole missile is a difficult problem in current research. An SR assessment model based on competition failure of multi-components in missile is proposed. By analyzing the missile life profile and its storage failure feature, the key components in missile are obtained and the characteristics voltage is assumed to be its key performance parameter. When the voltage testing data of key components in missile are available, a state space model (SSM) is applied to obtain the whole missile degradation state, which is defined as the missile degradation degree (DD). A Wiener process with the time-scale model (TSM) is applied to build the degradation failure model with individual variability and nonlinearity. The Weibull distribution and proportional risk model are applied to build an outburst failure model with performance degradation effect. Furthermore, a competition failure model with the correlation between degradation failure and outburst failure is proposed. A numerical example with a set of missiles in storage is analyzed to demonstrate the accuracy and superiority of the proposed model.展开更多
基金supported by the National Natural Science Foundation of China(61503014,62073009)。
文摘Degradation and overstress failures occur in many electronic systems in which the operation load and environmental conditions are complex.The dependency of them called dependent competing failure process(DCFP),has been widely studied.Electronic system may experience mutual effects of degradation and shocks,they are considered to be interdependent.Both the degradation and the shock processes will decrease the limit of system and cause cumulative effect.Finally,the competition of hard and soft failure will cause the system failure.Based on the failure mechanism accumulation theory,this paper constructs the shock-degradation acceleration and the threshold descent model,and a system reliability model established by using these two models.The mutually DCFP effect of electronic system interaction has been decomposed into physical correlation of failure,including acceleration,accumulation and competition.As a case,a reliability of electronic system in aeronautical system has been analyzed with the proposed method.The method proposed is based on failure physical evaluation,and could provide important reference for quantitative evaluation and design improvement of the newly designed system in case of data deficiency.
基金supported by the National Defense Foundation of China(71601183)
文摘The degradation data of multi-components in missile is derived by periodical testing. How to use these data to assess the storage reliability (SR) of the whole missile is a difficult problem in current research. An SR assessment model based on competition failure of multi-components in missile is proposed. By analyzing the missile life profile and its storage failure feature, the key components in missile are obtained and the characteristics voltage is assumed to be its key performance parameter. When the voltage testing data of key components in missile are available, a state space model (SSM) is applied to obtain the whole missile degradation state, which is defined as the missile degradation degree (DD). A Wiener process with the time-scale model (TSM) is applied to build the degradation failure model with individual variability and nonlinearity. The Weibull distribution and proportional risk model are applied to build an outburst failure model with performance degradation effect. Furthermore, a competition failure model with the correlation between degradation failure and outburst failure is proposed. A numerical example with a set of missiles in storage is analyzed to demonstrate the accuracy and superiority of the proposed model.
