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Effect of Low-frequency Power on F, CF_2 Relative Density and F/CF_2 Ratio in Fluorocarbon Dual-Frequency Plasmas 被引量:1
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作者 黄宏伟 叶超 +3 位作者 徐轶君 袁圆 施国峰 宁兆元 《Plasma Science and Technology》 SCIE EI CAS CSCD 2010年第5期566-570,共5页
Effect of low-frequency power on F, CF2 relative density and F/CF2 ratio, in C2F6, C4F8 and CHF3 dual-frequency capacitively couple discharge driven by the power of 13.56 MHz/2 MHz, was investigated by using optical e... Effect of low-frequency power on F, CF2 relative density and F/CF2 ratio, in C2F6, C4F8 and CHF3 dual-frequency capacitively couple discharge driven by the power of 13.56 MHz/2 MHz, was investigated by using optical emission spectroscopy. High F, CF2 relative density and high F/CF2 ratio were obtained in a CHF3 plasma. But for C2F6 and C4Fs plasmas, the F, CF2 relative density and F/CF2 ratio all decreased significantly due to the difference in both reactive paths and reactive energy. The increase of LF power caused simultaneous increase of F and CF2 radical relative densities in C4Fs and CHF3 plasmas, but led to increase of F with the decrease in CF2 relative densities in C2F6 plasma due to the increase of lower energy electrons and the decrease of higher energy electrons in electron energy distribution function (EEDF). 展开更多
关键词 fluorocarbon plasma dual-frequency discharge low-k films etching
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Simulation of Capacitively Coupled Dual-Frequency N_2,O_2,N_2/O_2 Discharges:Effects of External Parameters on Plasma Characteristics
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作者 尤左伟 戴忠玲 王友年 《Plasma Science and Technology》 SCIE EI CAS CSCD 2014年第4期335-343,共9页
A one-dimensional fluid model is adopted to simulate the characteristics of N2, O2, and N2/O2 dual-frequency (DF) capacitively coupled plasmas (CCPs) under typical conditions in PECVD technologies. Not only the gr... A one-dimensional fluid model is adopted to simulate the characteristics of N2, O2, and N2/O2 dual-frequency (DF) capacitively coupled plasmas (CCPs) under typical conditions in PECVD technologies. Not only the ground, the excited states but also the vibration levels of the main species are considered. The study focuses on the influence of external parameters such as matching of the high-frequency (HF) and low-frequency (LF), HF and LF of the voltage sources, as well as discharge pressures, on physical characteristics of discharges. The results show that the decoupling of the two sources is possible by increasing the applied HF, the electron density and ion flux are determined only by the HF of the voltage source, whereas the LF has a little influence on the plasma characteristics. In addition, the matching of frequency affects the characteristics of discharges to some extent. Fhrthermore, the pressure is a main external parameter affecting the characteristics of discharges, and a small amount of oxygen in N2 plasma can efficiently increase N+ ion flux incident onto the electrode and the density of N atom. 展开更多
关键词 CCP dual-frequency fluid model N2 discharge O2 discharge
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大气压双频氦气放电特性的数值模拟研究 被引量:2
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作者 王一男 李帅星 +4 位作者 刘悦 金莹 王莉 张艳华 石凤艳 《真空科学与技术学报》 EI CAS CSCD 北大核心 2018年第7期590-597,共8页
采用1-D流体模型对大气压裸金属电极结构的双频驱动氦气放电特性进行了研究。模型中考虑了氦等离子体放电过程中的6种粒子和13个基本反应过程。研究了双频调制大气压氦气放电中高低频电压、高低频频率等不同匹配方式对等离子体参数的影... 采用1-D流体模型对大气压裸金属电极结构的双频驱动氦气放电特性进行了研究。模型中考虑了氦等离子体放电过程中的6种粒子和13个基本反应过程。研究了双频调制大气压氦气放电中高低频电压、高低频频率等不同匹配方式对等离子体参数的影响,并且通过对电子密度、电场强度、电流密度以及电子加热机制等分析了大气压氦气放电双频调控机制。研究表明:高频源电压及高频源频率对放电特性的影响要大于低频源电压和频率;电子密度、电子温度等随着高频源电压和频率的增加而增加,随着低频源电压的增加而减小,低频源频率将不影响电子密度及电子温度。本文的研究为大气压气体放电提供了更多的优化等离子体参数的手段。 展开更多
关键词 双频调制 大气压气体放电 数值模拟
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C_2F_6 /O_2 /Ar Plasma Chemistry of 60 MHz/2 MHz Dual-Frequency Discharge and Its Effect on Etching of SiCOH Low-k Film
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作者 袁颖 叶超 +6 位作者 陈天 葛水兵 刘卉敏 崔进 徐轶君 邓艳红 宁兆元 《Plasma Science and Technology》 SCIE EI CAS CSCD 2012年第1期48-53,共6页
This work investigated C2F6/O2/Ar plasma chemistry and its effect on the etching characteristics of SiCOH low-k dielectrics in 60 MHz/2 MHz dual-frequency capacitively coupled discharge. For the C2F6/Ar plasma, the in... This work investigated C2F6/O2/Ar plasma chemistry and its effect on the etching characteristics of SiCOH low-k dielectrics in 60 MHz/2 MHz dual-frequency capacitively coupled discharge. For the C2F6/Ar plasma, the increase in the low-frequency (LF) power led to an increased ion impact, prompting the dissociation of C2F6 with higher reaction energy. As a result, fluorocarbon radicals with a high F/C ratio decreased. The increase in the discharge pressure led to a decrease in the electron temperature, resulting in the decrease of C2F6 dissociation. For the C2F6/O2/Ar plasma, the increase in the LF power prompted the reaction between 02 and C2F6, resulting in the elimination of CF3 and CF2 radicals, and the production of an F-rich plasma environment. The F-rich plasma improved the etching characteristics of SiCOH low-k films, leading to a high etching rate and a smooth etched surface. 展开更多
关键词 fluorocarbon plasma dual-frequency discharge low-k films etching
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CHF_3等离子体刻蚀SiCOH低k薄膜的机理分析 被引量:1
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作者 崔进 刘卉敏 +1 位作者 邓艳红 叶超 《苏州大学学报(自然科学版)》 CAS 2011年第1期48-51,57,共5页
通过对SiCOH低k薄膜刻蚀后的表面状态分析、等离子体空间活性基团分析,并通过调节刻蚀时的离子轰击能量,从实验上研究了碳氟等离子体刻蚀SiCOH低k薄膜的基本过程,发现刻蚀过程中SiCOH薄膜表面的C:F沉积、到达SiCOH薄膜表面的F原子密度... 通过对SiCOH低k薄膜刻蚀后的表面状态分析、等离子体空间活性基团分析,并通过调节刻蚀时的离子轰击能量,从实验上研究了碳氟等离子体刻蚀SiCOH低k薄膜的基本过程,发现刻蚀过程中SiCOH薄膜表面的C:F沉积、到达SiCOH薄膜表面的F原子密度以及传递到SiCOH薄膜表面的能量是决定SiCOH薄膜刻蚀的主要因素,符合Sankaran的碳氟等离子体刻蚀SiO2薄膜模型.在等离子体空间的CF2基团浓度较低、F基团浓度较高时,并且施加给待刻蚀薄膜的偏置功率较高时,SiCOH薄膜表面沉积的C:F薄膜层较薄,有利于等离子体空间的F基团和离子轰击薄膜的能量传递到SiCOH薄膜表面,从而使SiCOH薄膜表面的F、Si反应几率增大,实现SiCOH薄膜的有效刻蚀. 展开更多
关键词 SiCOH薄膜刻蚀 CHF3等离子体 双频电容耦合放电
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O_2流量对O_2/C_2F_6等离子体处理的硅油光致发光性能影响
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作者 陈天 钱侬 +1 位作者 袁颖 叶超 《苏州大学学报(自然科学版)》 CAS 2012年第2期59-63,69,共6页
研究了O2/C2F6等离子体处理的硅油光致发光性能.发光谱覆盖了250~600 nm的光谱范围,由290nm、410 nm、468 nm、481 nm、491 nm和552 nm的6个发光峰组成.O2流量的增大使290 nm、410 nm、552 nm的发光峰增强,468 nm的发光峰强度减弱.光... 研究了O2/C2F6等离子体处理的硅油光致发光性能.发光谱覆盖了250~600 nm的光谱范围,由290nm、410 nm、468 nm、481 nm、491 nm和552 nm的6个发光峰组成.O2流量的增大使290 nm、410 nm、552 nm的发光峰增强,468 nm的发光峰强度减弱.光致发光性能与等离子体作用导致的氧缺乏中心、C悬挂键、Si悬挂键的形成有关. 展开更多
关键词 硅油 光致发光 o2/c2f6等离子体 双频电容耦合放电
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O_2流量对O_2/C_4F_8等离子体刻蚀SiCOH低k薄膜的影响
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作者 刘卉敏 周峰 +2 位作者 崔进 邓艳红 叶超 《苏州大学学报(自然科学版)》 CAS 2011年第2期53-57,共5页
研究了O2/C4F8等离子体刻蚀SiCOH低k薄膜时O2流量对刻蚀率、表面结构的影响,及其放电等离子体特性的关联.发现O2流量的增大可以极大地提高多孔SiCOH薄膜的刻蚀速率,降低表面的粗糙度,减少SiCOH薄膜表面的C:F沉积.等离子体特性的光谱分... 研究了O2/C4F8等离子体刻蚀SiCOH低k薄膜时O2流量对刻蚀率、表面结构的影响,及其放电等离子体特性的关联.发现O2流量的增大可以极大地提高多孔SiCOH薄膜的刻蚀速率,降低表面的粗糙度,减少SiCOH薄膜表面的C:F沉积.等离子体特性的光谱分析表明,O2的添加,增强了C与O之间的反应,从而在Si、F反应刻蚀Si的同时,C、O之间的反应使C消耗,实现Si、C的同步刻蚀,从而获得SiCOH低k薄膜的高刻蚀率和低粗糙度表面. 展开更多
关键词 SiCOH薄膜刻蚀 O2/C4F8等离子体 双频电容耦合放电
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C_2F_6、C_4F_8的双频电容耦合等离子体特性研究
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作者 黄宏伟 钱侬 叶超 《苏州大学学报(自然科学版)》 CAS 2010年第3期66-72,共7页
采用发射光谱技术,研究了C2F6、C4F8气体的双频电容耦合放电等离子体中F、CF2基团密度以及F/CF2强度比随高频功率、低频功率、放电气压的变化关系.实验结果表明,在双频电容耦合放电等离子体中,高频功率、低频功率、放电气压的改变,使C2F... 采用发射光谱技术,研究了C2F6、C4F8气体的双频电容耦合放电等离子体中F、CF2基团密度以及F/CF2强度比随高频功率、低频功率、放电气压的变化关系.实验结果表明,在双频电容耦合放电等离子体中,高频功率、低频功率、放电气压的改变,使C2F6或C4F8等离子体中出现不同分解过程,这种对气体分解反应的选择性为实现双频等离子体刻蚀薄膜的精确控制提供了可能. 展开更多
关键词 C2F6、C4F8等离子体 双频电容耦合放电 等离子体发射光谱
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Effect of Discharge Parameters on Properties of Diamond-Like Carbon Films Prepared by Dual-Frequency Capacitively Coupled Plasma Source 被引量:1
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作者 杨磊 辛煜 +2 位作者 徐海鹏 虞一青 宁兆元 《Plasma Science and Technology》 SCIE EI CAS CSCD 2010年第1期53-58,共6页
Diamond-like carbon (DLC) films were prepared with CH4-Ar using a capacitively coupled plasma enhanced chemical vapor deposition (CCP-CVD) method driven by dual-frequency of 41 MHz and 13.56 MHz in combination. Du... Diamond-like carbon (DLC) films were prepared with CH4-Ar using a capacitively coupled plasma enhanced chemical vapor deposition (CCP-CVD) method driven by dual-frequency of 41 MHz and 13.56 MHz in combination. Due to a coupling via bulk plasma, the self-bias voltage depended not only on the radiofrequency (RF) power of the corresponding electrode but also on another RF power of the counter electrode. The influence of the discharge parameters on the deposition rate, optical and Raman properties of the deposited films was investigated. The optical band decreased basically with the increase in the input power of both the low frequency and high frequency. Raman measurements show that the deposited films have a maximal sp3 content with an applied negative self-bias voltage of -150 V, while high frequency power causes a continuous increase in the sp3 content. The measurement of atomic force microscope (AFM) shows that the surface of the deposited films under ion-bombardment becomes smoother than those with non-intended self-bias voltage. 展开更多
关键词 dual-frequency capacitively coupled discharge DLC Raman spectroscopy
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CHF3双频电容耦合放电等离子体特性研究
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作者 胡佳 徐轶君 叶超 《物理学报》 SCIE EI CAS CSCD 北大核心 2010年第4期2661-2665,共5页
研究了用于SiCOH低介电常数薄膜刻蚀的CHF3气体在13.56MHz/2MHz,27.12MHz/2MHz和60MHz/2MHz双频电容耦合放电时的等离子体性质.发现2MHz低频源功率的增大主要导致F基团密度的增大;而高频频率从13.56,27.12增大到60MHz,导致CF2基团的密... 研究了用于SiCOH低介电常数薄膜刻蚀的CHF3气体在13.56MHz/2MHz,27.12MHz/2MHz和60MHz/2MHz双频电容耦合放电时的等离子体性质.发现2MHz低频源功率的增大主要导致F基团密度的增大;而高频频率从13.56,27.12增大到60MHz,导致CF2基团的密度增大和电极之间F基团密度的轴向空间不均匀性增加.根据电子温度的分布规律及离子能量随高频源频率的变化关系,提出CF2基团的产生主要通过电子-中性气体碰撞,而F基团的产生是离子-中性气体碰撞的结果. 展开更多
关键词 双频电容耦合放电 CHF3等离子体
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大气压双频Ar/O_(2)放电等离子体特性的数值模拟
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作者 崔明晨 王一男 《真空科学与技术学报》 CAS CSCD 北大核心 2023年第11期977-986,共10页
文章采用等离子体流体理论模型,研究了双频容性耦合放电中高频源频率对大气压氩气与氧气混合气体放电等离子体的各类粒子密度与各项等离子体参数的影响。通过模拟不同高频源频率的放电,得到了放电空间中各类粒子的密度、电子温度、电场... 文章采用等离子体流体理论模型,研究了双频容性耦合放电中高频源频率对大气压氩气与氧气混合气体放电等离子体的各类粒子密度与各项等离子体参数的影响。通过模拟不同高频源频率的放电,得到了放电空间中各类粒子的密度、电子温度、电场等参数的一维时空分布,进一步了解了双频放电中高频源频率对等离子体特性的影响作用。研究结果表明:当放电电压固定时,随高频源频率的升高,电子密度逐渐增大;电子温度、电场与电势有下降的趋势;各类氩离子密度与氩原子的亚稳态密度随高频源频率的升高而增大;随高频源频率的升高,各类氧离子密度增大,氧原子密度先减小后增大,氧分子的亚稳态密度先增大后减小。电子压力加热、电子欧姆加热、电子加热和能量损失受高频源频率的影响均逐步升高。此外,有效电流密度与有效功率密度随高频源频率的升高大体增加。 展开更多
关键词 大气压 双频放电 数值模拟
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大气压双频氦气放电等离子体特性的数值研究 被引量:2
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作者 王一男 孟晓东 +4 位作者 李帅星 金莹 王莉 张艳华 石凤燕 《核聚变与等离子体物理》 CAS CSCD 北大核心 2019年第4期373-378,共6页
用一维流体模型研究了大气压双频氦气放电等离子体的特性。数值模拟的结果表明,在单、双频放电中,随着应用电压的增加,电子密度和放电电流都增加。相对于单频放电,双频放电中低频源的耦合效应使得放电中的电流以及电子密度降低。随着低... 用一维流体模型研究了大气压双频氦气放电等离子体的特性。数值模拟的结果表明,在单、双频放电中,随着应用电压的增加,电子密度和放电电流都增加。相对于单频放电,双频放电中低频源的耦合效应使得放电中的电流以及电子密度降低。随着低频源电压峰值的增加,电子密度降低,离子通量,电子损失能量以及电子吸收能量均降低;但电子温度和电势随着低频源电压峰值的增加而增加。在相同低频源电压下,随着高频源电压的增加离子流非线性增加。 展开更多
关键词 数值模拟 双频放电 氦气等离子体
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Effects of secondary electron emission on plasma characteristics in dual-frequency atmospheric pressure helium discharge by fluid modeling
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作者 Yi-Nan Wang Shuai-Xing Li +1 位作者 Yue Liu Li Wang 《Chinese Physics B》 SCIE EI CAS CSCD 2019年第2期346-351,共6页
A one-dimensional(1D) fluid simulation of dual frequency discharge in helium gas at atmospheric pressure is carried out to investigate the role of the secondary electron emission on the surfaces of the electrodes. In ... A one-dimensional(1D) fluid simulation of dual frequency discharge in helium gas at atmospheric pressure is carried out to investigate the role of the secondary electron emission on the surfaces of the electrodes. In the simulation, electrons,ions of He^+ and He_2^+, metastable atoms of He*and metastable molecules of He*_2 are included. It is found that the secondary electron emission coefficient significantly influences plasma density and electric field as well as electron heating mechanisms and ionization rate. The particle densities increase with increasing SEE coefficient from 0 to 0.3 as well as the sheath's electric field and electron source. Moreover, the SEE coefficient also influences the electron heating mechanism and electron power dissipation in the plasma and both of them increase with increasing SEE coefficient within the range from 0 to 0.3 as a result of increasing of electron density. 展开更多
关键词 dual frequency SECONDARY electron emission ATMOSPHERIC pressure discharge
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2-D FLUID SIMULATION OF DUAL-FREQUENCY CAPACITIVELY COUPLED PLASMA
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作者 LU Yi-jia YAN Da-qiang CHEN Yao-song 《Journal of Hydrodynamics》 SCIE EI CSCD 2009年第6期814-819,共6页
Dual-frequency aegon discharge at 100 m Torr is modeled with a 2-D fluid model in this study. The plate gap of the system is 20 ram, and discharges are modeled at High Frequency (HF) 40 MHz, 60 MHz, 80 MHz, Low Freq... Dual-frequency aegon discharge at 100 m Torr is modeled with a 2-D fluid model in this study. The plate gap of the system is 20 ram, and discharges are modeled at High Frequency (HF) 40 MHz, 60 MHz, 80 MHz, Low Frequency (LF) 2 MHz, 5 MHz, 10 MHz, low-frequency voltage 50 V, 75 V, 100 V and high-frequency voltage 200 V, respectively. The spatial distribution of electron density and ion density and the periodic evolution of instantaneous electric potential in bulk plasma and sheath are discussed. The numerical results show that plasma density increases with HFs and LFs and LF voltage, while HFs has more effect on the density. It is concluded that improving the ratio of HFs/LFs and increasing LF voltages is a method to gain high density and high ion bombardment energy simultaneously based on the analysis of electric potential distribution. 展开更多
关键词 dual frequency CCP discharge 2-D fluid model
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Effects of gas pressure on plasma characteristics in dual frequency argon capacitive glow discharges at low pressure by a self-consistent fluid model
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作者 赵璐璐 刘悦 Tagra Samir 《Chinese Physics B》 SCIE EI CAS CSCD 2017年第12期361-370,共10页
A self-consistent fluid model for dual radio frequency argon capacitive glow discharges at low pressure is established. Numerical results are obtained by using a finite difference method to solve the model numerically... A self-consistent fluid model for dual radio frequency argon capacitive glow discharges at low pressure is established. Numerical results are obtained by using a finite difference method to solve the model numerically, and the results are analyzed to study the effect of gas pressure on the plasma characteristics. It shows that when the gas pressure increases from 0.3 Torr (1 Torr=1.33322102 Pa) to 1.5 Torr, the cycle-averaged plasma density and the ionization rate increase; the cycle-averaged ion current densities and ion energy densities on the electrodes electrode increase; the cycle-averaged electron temperature decreases. Also, the instantaneous electron density in the powered sheath region is presented and discussed. The cycle-averaged electric field has a complex behavior with the increasing of gas pressure, and its changes take place mainly in the two sheath regions. The cycle-averaged electron pressure heating, electron ohmic heating, electron heating, and electron energy loss are all influenced by the gas pressure. Two peaks of the electron heating appear in the sheath regions and the two peaks become larger and move to electrodes as the gas pressure increases. 展开更多
关键词 dual frequency gas pressure glow discharge
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大气压双频容性耦合Ar/O_(2)等离子体特性研究
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作者 刘文静 刘相梅 《真空科学与技术学报》 CAS CSCD 北大核心 2023年第12期1081-1089,共9页
文章利用二维流体模型对双频调制大气压Ar/O_(2)放电特性进行了研究,着重讨论高低频电压、低频频率等不同匹配方式对等离子体参数的影响,并且通过对电子加热模式、电子密度、中性粒子密度、正离子能量以及正离子总通量等分析了大气压Ar/... 文章利用二维流体模型对双频调制大气压Ar/O_(2)放电特性进行了研究,着重讨论高低频电压、低频频率等不同匹配方式对等离子体参数的影响,并且通过对电子加热模式、电子密度、中性粒子密度、正离子能量以及正离子总通量等分析了大气压Ar/O_(2)放电双频调控机制。结果表明,低频源电压的改变使得电子加热模式由α模式转变为DA/α混合模式,且等离子体密度、正离子总通量及离子能量均随着低频电压的升高而增大,发生了解耦现象。与低频源电压不同,高频源电压和低频源频率对电子加热模式不产生影响。此外,高频源电压对等离子体密度及正离子总通量影响较大,对刻蚀工业中易对材料造成损伤的离子能量影响很小;而低频源频率对工业中影响影响较大的离子能量和离子总通量影响较大,对等离子体密度影响较小,实现了等离子体密度和离子能量的独立控制。 展开更多
关键词 双频容性耦合 Ar/O_(2)放电 大气压等离子体
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