Negative capacitance （NC） in dye-sensitized solar cells （DSCs） has been confirmed experimentally. In this work, the recombination behavior of carriers in DSC with semiconductor interface as a carder＇s transport l...Negative capacitance （NC） in dye-sensitized solar cells （DSCs） has been confirmed experimentally. In this work, the recombination behavior of carriers in DSC with semiconductor interface as a carder＇s transport layer is explored theoreti- cally in detail. Analytical results indicate that the recombination behavior of carriers could contribute to the NC of DSCs under small signal perturbation. Using this recombination capacitance we propose a novel equivalent circuit to completely explain the negative terminal capacitance. Further analysis based on the recombination complex impedance show that the NC is inversely proportional to frequency. In addition, analytical recombination resistance is composed by the alternating current （AC） recombination resistance （Rrac） and the direct current （DC） recombination resistance （Rrdc）, which are caused by small-signal perturbation and the DC bias voltage, respectively. Both of two parts will decrease with increasing bias voltage.展开更多
基金Project supported by the National Natural Science Foundation of China(Grant Nos.11204209 and 60876035)the Natural Science Foundation of Tianjin City,China(Grant No.13JCZDJC32800)
文摘Negative capacitance （NC） in dye-sensitized solar cells （DSCs） has been confirmed experimentally. In this work, the recombination behavior of carriers in DSC with semiconductor interface as a carder＇s transport layer is explored theoreti- cally in detail. Analytical results indicate that the recombination behavior of carriers could contribute to the NC of DSCs under small signal perturbation. Using this recombination capacitance we propose a novel equivalent circuit to completely explain the negative terminal capacitance. Further analysis based on the recombination complex impedance show that the NC is inversely proportional to frequency. In addition, analytical recombination resistance is composed by the alternating current （AC） recombination resistance （Rrac） and the direct current （DC） recombination resistance （Rrdc）, which are caused by small-signal perturbation and the DC bias voltage, respectively. Both of two parts will decrease with increasing bias voltage.
