The structural characteristics of the graphitized carbon microcrystal prepared from carbonized polyimide (PI) film were explored using X-ray diffraction technique. The experimental results show that the graphitization...The structural characteristics of the graphitized carbon microcrystal prepared from carbonized polyimide (PI) film were explored using X-ray diffraction technique. The experimental results show that the graphitization of the thin film was initiated by heat treatment around 2 100°C; the carbon layers of the thin film specimens heat-treated at 2 825°C and above possessed good orientation, the phenomenon of poly-phase graphitization appeared markedly, and the information of the mosaic structure of the sample was obtained; the interlayer spacing and the mosaic degree for 3 160°C heat-treated thin film samples are 0.335 45 nm and 5.4°, respectively. As far as the source of two crystal phases with a slight difference in graphitization degree is concerned, some inferences are discussed, which helps understand more about the structure of the graphitization products.展开更多
文摘The structural characteristics of the graphitized carbon microcrystal prepared from carbonized polyimide (PI) film were explored using X-ray diffraction technique. The experimental results show that the graphitization of the thin film was initiated by heat treatment around 2 100°C; the carbon layers of the thin film specimens heat-treated at 2 825°C and above possessed good orientation, the phenomenon of poly-phase graphitization appeared markedly, and the information of the mosaic structure of the sample was obtained; the interlayer spacing and the mosaic degree for 3 160°C heat-treated thin film samples are 0.335 45 nm and 5.4°, respectively. As far as the source of two crystal phases with a slight difference in graphitization degree is concerned, some inferences are discussed, which helps understand more about the structure of the graphitization products.
