针对微弱光信号探测系统中雪崩光电二极管(APD)在工作中的温漂特性,提出了一种适合APD的闭环温度控制方法。该方法将APD、热敏电阻器和TEC制冷器集成在同一组件中,采用模拟电路深度负反馈技术实现闭环温度控制,并运用经典的控制理论建...针对微弱光信号探测系统中雪崩光电二极管(APD)在工作中的温漂特性,提出了一种适合APD的闭环温度控制方法。该方法将APD、热敏电阻器和TEC制冷器集成在同一组件中,采用模拟电路深度负反馈技术实现闭环温度控制,并运用经典的控制理论建立数学模型对PID电路进行优化,保证了APD探测电路的增益稳定性。试验表明:该系统中APD光电探测器温度控制精度为±0.1℃,输出电压波动约为±0.5 m V,很好地抑制了外界温度变化对APD增益的影响。展开更多
This paper presents a circuit model for thin avalanche photodiodes （APDs）. In this model, the nonuniformity of the electric filed in the multiplication region is modeled using a stepwise method. The model also tries...This paper presents a circuit model for thin avalanche photodiodes （APDs）. In this model, the nonuniformity of the electric filed in the multiplication region is modeled using a stepwise method. The model also tries to take the effects of carrier＇s position dependent properties, like carder＇s dead length and the history of carder＇s previous ionization into account by developing an effective electric field in the multiplication region. The output photocurrent and multiplication gain obtained from the proposed model for different lengths of the multi- plication region achieve a good agreement in comparison with available experimental data. In addition, calculated excess noise factor reveals the model ability for noise and sensitivity analysis.展开更多
文摘针对微弱光信号探测系统中雪崩光电二极管(APD)在工作中的温漂特性,提出了一种适合APD的闭环温度控制方法。该方法将APD、热敏电阻器和TEC制冷器集成在同一组件中,采用模拟电路深度负反馈技术实现闭环温度控制,并运用经典的控制理论建立数学模型对PID电路进行优化,保证了APD探测电路的增益稳定性。试验表明:该系统中APD光电探测器温度控制精度为±0.1℃,输出电压波动约为±0.5 m V,很好地抑制了外界温度变化对APD增益的影响。
文摘This paper presents a circuit model for thin avalanche photodiodes （APDs）. In this model, the nonuniformity of the electric filed in the multiplication region is modeled using a stepwise method. The model also tries to take the effects of carrier＇s position dependent properties, like carder＇s dead length and the history of carder＇s previous ionization into account by developing an effective electric field in the multiplication region. The output photocurrent and multiplication gain obtained from the proposed model for different lengths of the multi- plication region achieve a good agreement in comparison with available experimental data. In addition, calculated excess noise factor reveals the model ability for noise and sensitivity analysis.
