以正硅酸乙酯(TEOS)及3-氨基丙基三乙氧基硅烷(ATOS)为原料,采用溶胶-凝胶法对聚磷酸铵(APP)进行了表面改性并用于阻燃环氧树脂。结果表明:TEOS及ATOS通过水解、聚合反应在改性APP(MAPP)表面生成了一层致密且类似荷叶表面微-纳米结构的...以正硅酸乙酯(TEOS)及3-氨基丙基三乙氧基硅烷(ATOS)为原料,采用溶胶-凝胶法对聚磷酸铵(APP)进行了表面改性并用于阻燃环氧树脂。结果表明:TEOS及ATOS通过水解、聚合反应在改性APP(MAPP)表面生成了一层致密且类似荷叶表面微-纳米结构的聚硅氧烷膜,MAPP的溶解度由0.62降低为0.18 g/100 m L水,疏水性及耐水性明显增强。展开更多
Two kinds of commercial ammonium polyphosphate （APP） and three kinds of APP which were prepared in the laboratory were studied by X-ray diffraction （XRD）, Fourier transforms infrared spectroscopy （FTIR）, scannin...Two kinds of commercial ammonium polyphosphate （APP） and three kinds of APP which were prepared in the laboratory were studied by X-ray diffraction （XRD）, Fourier transforms infrared spectroscopy （FTIR）, scanning electron microscopy （SEM） and transmission electron microscopy （TEM）. In identification of the form Ⅱ crystal APP by XRD and FTIR, some discrepancies were discussed. It is pointed out that the absorbance of the FTIR spectra at 682 cm^-1 can exist not only in the form Ⅰ APP, but also in the form Ⅱ APP with the crystal lattice defects. The SEM images indicate that the form Ⅱ APP is of multilayer crystal structure. XRD and TEM can reveal the crystal lattice defects.展开更多
文摘以正硅酸乙酯(TEOS)及3-氨基丙基三乙氧基硅烷(ATOS)为原料,采用溶胶-凝胶法对聚磷酸铵(APP)进行了表面改性并用于阻燃环氧树脂。结果表明:TEOS及ATOS通过水解、聚合反应在改性APP(MAPP)表面生成了一层致密且类似荷叶表面微-纳米结构的聚硅氧烷膜,MAPP的溶解度由0.62降低为0.18 g/100 m L水,疏水性及耐水性明显增强。
基金Sponsored by the National Key Technology R&D Program(2006BAE03B05-2)
文摘Two kinds of commercial ammonium polyphosphate （APP） and three kinds of APP which were prepared in the laboratory were studied by X-ray diffraction （XRD）, Fourier transforms infrared spectroscopy （FTIR）, scanning electron microscopy （SEM） and transmission electron microscopy （TEM）. In identification of the form Ⅱ crystal APP by XRD and FTIR, some discrepancies were discussed. It is pointed out that the absorbance of the FTIR spectra at 682 cm^-1 can exist not only in the form Ⅰ APP, but also in the form Ⅱ APP with the crystal lattice defects. The SEM images indicate that the form Ⅱ APP is of multilayer crystal structure. XRD and TEM can reveal the crystal lattice defects.
