Accelerated life test (ALT) is an important branch of reliability test and is a focus of research both for statisticians and reliability engineers. The paper outlines the four topics of study embodied in ALT: statisti...Accelerated life test (ALT) is an important branch of reliability test and is a focus of research both for statisticians and reliability engineers. The paper outlines the four topics of study embodied in ALT: statistical analysis of constant-stress test, step-stress test and progressive stress test, and optimal design of ALT. It gives a general review of engineering applications of ALT, and points out some possible directions in ALT, gives some suggestions for further study.展开更多
To assess the lifetime distribution of highly reliable or expensive product,one of the most commonly used strategies is to construct step-stress accelerated degradation test(SSADT)which can curtail the test duration a...To assess the lifetime distribution of highly reliable or expensive product,one of the most commonly used strategies is to construct step-stress accelerated degradation test(SSADT)which can curtail the test duration and reduce the test cost.In reality,it is not unusual for a unit with a higher degradation rate which exhibits a more volatile degradation path.Recently,Ye,Chen,and Shen[(2015).A new class of Wiener process models for degradation analysis.Reliability Engineering and System Safety,139,58–67]proposed a Wiener process to capture the positive correlation between the drift rate and the volatility.In this paper,an optimal SSADT plan is developed under the assumption that the underlying degradation path follows the Wiener process with correlation.Firstly,the stochastic diffusion process is introduced to model a typical SSADT problem.Then the design variables,including the sample size,the measurement frequency and the numbers of measurements under each stress level,are optimised by minimising the asymptotic variance of the estimated p-percentile of the product’s lifetime distribution subject to the total experimental cost not exceeding a pre-specified budget.Finally,a numerical example is presented to illustrate the proposed method.展开更多
The TFR（Tampered Failure Rate） model was proposed by Bhattacharyya and Soejoeti（1989） for step-stress accelerated life tests, On step-stress completely accelerated test occasions, the paper gives a method of estim...The TFR（Tampered Failure Rate） model was proposed by Bhattacharyya and Soejoeti（1989） for step-stress accelerated life tests, On step-stress completely accelerated test occasions, the paper gives a method of estimating parameters under a normal stress.展开更多
文摘Accelerated life test (ALT) is an important branch of reliability test and is a focus of research both for statisticians and reliability engineers. The paper outlines the four topics of study embodied in ALT: statistical analysis of constant-stress test, step-stress test and progressive stress test, and optimal design of ALT. It gives a general review of engineering applications of ALT, and points out some possible directions in ALT, gives some suggestions for further study.
基金Rong-Xian Yue’s research was supported by the National Natural Science Foundation of China[grant number 11471216]Daojiang He’s research was supported by the National Natural Science Foundation of China[grant number 11201005].
文摘To assess the lifetime distribution of highly reliable or expensive product,one of the most commonly used strategies is to construct step-stress accelerated degradation test(SSADT)which can curtail the test duration and reduce the test cost.In reality,it is not unusual for a unit with a higher degradation rate which exhibits a more volatile degradation path.Recently,Ye,Chen,and Shen[(2015).A new class of Wiener process models for degradation analysis.Reliability Engineering and System Safety,139,58–67]proposed a Wiener process to capture the positive correlation between the drift rate and the volatility.In this paper,an optimal SSADT plan is developed under the assumption that the underlying degradation path follows the Wiener process with correlation.Firstly,the stochastic diffusion process is introduced to model a typical SSADT problem.Then the design variables,including the sample size,the measurement frequency and the numbers of measurements under each stress level,are optimised by minimising the asymptotic variance of the estimated p-percentile of the product’s lifetime distribution subject to the total experimental cost not exceeding a pre-specified budget.Finally,a numerical example is presented to illustrate the proposed method.
文摘The TFR（Tampered Failure Rate） model was proposed by Bhattacharyya and Soejoeti（1989） for step-stress accelerated life tests, On step-stress completely accelerated test occasions, the paper gives a method of estimating parameters under a normal stress.
