As electronic packages become more compact, run at faster speeds and dissipate more heat, package designers need more effective thermal management materials. CVD diamond, because of its high thermal conductivity, low ...As electronic packages become more compact, run at faster speeds and dissipate more heat, package designers need more effective thermal management materials. CVD diamond, because of its high thermal conductivity, low dielectric loss and its great mechanical strength, is an excellent material for three dimensional （319） multichip modules （MCMs） in the next generation compact high speed computers and high power microwave components. In this paper, we have synthesized a large area freestanding diamond films and substrates, and polished diamond substrates, which make MCMs diamond film sink becomes a reality.展开更多
本文主要说明了淀积型多芯片组件(MCM-D)技术所使用的主要材料的热特性。此技术采用倒装片技术把硅芯片安装到硅基板上。阐述了薄膜电阻和接触电阻的测量与所使用金属的温度范围-28℃-100℃的比较。一套典型的试验结构诸如开尔文接触、...本文主要说明了淀积型多芯片组件(MCM-D)技术所使用的主要材料的热特性。此技术采用倒装片技术把硅芯片安装到硅基板上。阐述了薄膜电阻和接触电阻的测量与所使用金属的温度范围-28℃-100℃的比较。一套典型的试验结构诸如开尔文接触、横桥电阻(CBR)及Van der Pauw 结构不仅已用于此技术,而且为了测试通过球倒装片连接的接触电阻,采用一新的开尔文式结构。已获得MCM封装的热模型,并考虑由此类封装增加的所有的热电阻。展开更多
基金Supported by National Natural Science Foundation of China (No.60371006)
文摘As electronic packages become more compact, run at faster speeds and dissipate more heat, package designers need more effective thermal management materials. CVD diamond, because of its high thermal conductivity, low dielectric loss and its great mechanical strength, is an excellent material for three dimensional （319） multichip modules （MCMs） in the next generation compact high speed computers and high power microwave components. In this paper, we have synthesized a large area freestanding diamond films and substrates, and polished diamond substrates, which make MCMs diamond film sink becomes a reality.
文摘本文主要说明了淀积型多芯片组件(MCM-D)技术所使用的主要材料的热特性。此技术采用倒装片技术把硅芯片安装到硅基板上。阐述了薄膜电阻和接触电阻的测量与所使用金属的温度范围-28℃-100℃的比较。一套典型的试验结构诸如开尔文接触、横桥电阻(CBR)及Van der Pauw 结构不仅已用于此技术,而且为了测试通过球倒装片连接的接触电阻,采用一新的开尔文式结构。已获得MCM封装的热模型,并考虑由此类封装增加的所有的热电阻。
