This article provides a review of current research activities that concentrate on Ti3SiC2. We begin with an overview of the crystal and electronic structures, which are the basis to understand this material. Following...This article provides a review of current research activities that concentrate on Ti3SiC2. We begin with an overview of the crystal and electronic structures, which are the basis to understand this material. Followings are the synthetic strategies that have been exploited to achieve, and the formation mechanism of Ti3SiC2. Then we devote much attentions to the mechanical properties and oxidation/hot corrosion behaviors of Ti3SiC2 as well as some advances achieved recently. At the end of this paper, we elaborate on some new discoveries in the Ti3SiC2 system, and also give a brief discussion focused on the ＂microstructure -property＂ relationship.展开更多
Layered ternary ceramics represent a new class of solids that combine the merits of both metals and ceramics.These unique properties are strongly related to their layered crystal structures and microstructures. The co...Layered ternary ceramics represent a new class of solids that combine the merits of both metals and ceramics.These unique properties are strongly related to their layered crystal structures and microstructures. The combination of atomic-resolution Z-contrast scanning transmission electron microscopy （STEM） and transmission electron microscopy （TEM）, selected area electron diffraction （SAED）, convergent beam electron diffraction （CBED） represents a powerful method to link microstructures of materials to macroscopic properties, allowing layered ternary ceramics to be investigated in an unprecedented detail. Vicrostructural information obtained using TEM is useful in understanding the formation mechanism, layered stacking characteristics, and defect structures for layered ternary ceramics down to atomic-scale level; and thus provides insight into understanding the ＂Processing-Structure-Property＂ relationship of layered ternary ceramics. Transmission electron microscopic characterizations of layered ternary ceramics in Ti-Si-C, Ti-Al-C, Cr-Al-C, Zr-Al-C, Ta-Al-C and Ti-Al-N systems are reviewed.展开更多
基金supported by the National Outstanding Young Scientist Foundation for Y.C. Zhou under Grant No. 59925208the National Natural Science Foundation of China under Grants No. 50232040, No. 50302011 and No. 90403027"863" Project,and High-Tech Bureau of the Chinese Academy of Sciences
文摘This article provides a review of current research activities that concentrate on Ti3SiC2. We begin with an overview of the crystal and electronic structures, which are the basis to understand this material. Followings are the synthetic strategies that have been exploited to achieve, and the formation mechanism of Ti3SiC2. Then we devote much attentions to the mechanical properties and oxidation/hot corrosion behaviors of Ti3SiC2 as well as some advances achieved recently. At the end of this paper, we elaborate on some new discoveries in the Ti3SiC2 system, and also give a brief discussion focused on the ＂microstructure -property＂ relationship.
文摘Layered ternary ceramics represent a new class of solids that combine the merits of both metals and ceramics.These unique properties are strongly related to their layered crystal structures and microstructures. The combination of atomic-resolution Z-contrast scanning transmission electron microscopy （STEM） and transmission electron microscopy （TEM）, selected area electron diffraction （SAED）, convergent beam electron diffraction （CBED） represents a powerful method to link microstructures of materials to macroscopic properties, allowing layered ternary ceramics to be investigated in an unprecedented detail. Vicrostructural information obtained using TEM is useful in understanding the formation mechanism, layered stacking characteristics, and defect structures for layered ternary ceramics down to atomic-scale level; and thus provides insight into understanding the ＂Processing-Structure-Property＂ relationship of layered ternary ceramics. Transmission electron microscopic characterizations of layered ternary ceramics in Ti-Si-C, Ti-Al-C, Cr-Al-C, Zr-Al-C, Ta-Al-C and Ti-Al-N systems are reviewed.
