Focused ion-beam-induced deposition （FIBID） and focused electron-beam-induced deposition （FEBID） are conve- nient and useful in nanodevice fabrication. Since the deposition is from the organometallic platinum prec...Focused ion-beam-induced deposition （FIBID） and focused electron-beam-induced deposition （FEBID） are conve- nient and useful in nanodevice fabrication. Since the deposition is from the organometallic platinum precursor, the con- ductive lines directly written by focused ion-beam （FIB） and focused electron-beam （FEB） are carbon-rich materials. We discuss an alternative approach to enhancing the platinum content and improving the conductivity of the conductive leads produced by FIBID and FEBID, namely an annealing treatment. Annealing in pure oxygen at 500 ℃ for 30 min enhances the platinum content values from ~ 18% to 30% and ~ 50% to 90% of FIBID and FEBID, respectively. Moreover, we find that thin films will be formed in the FIBID and FEBID processes. The annealing treatment is helpful to avoid the current leakage caused by these thin films. A single electron transistor is fabricated by FEBID and the current-voltage curve shows the Coulomb blockade effect.展开更多
Negative ion-beam-induced luminescence (IBIL) measurements of a pure LiF crystal using 20 keV are performed to monitor the formation and annihilation of luminescence centers during ion irradiation. Several emission ba...Negative ion-beam-induced luminescence (IBIL) measurements of a pure LiF crystal using 20 keV are performed to monitor the formation and annihilation of luminescence centers during ion irradiation. Several emission bands are observed in the IBIL spectra and the evolvement mechanisms of the corresponding centers are identified. The difference between the IBIL measurements using positive ions and negative ions is that the intensities of luminescence centers can reach the maxima at lower fluences under negative-ion irradiation due to free charge accumulation.展开更多
在BNU400注入机上搭建的离子激发发光(ion beam induced luminescence,IBIL)测量装置上,开展了相同能量(100 keV)条件下的3种离子(H^+、He^+以及O^+)辐照氟化锂材料时的IBIL光谱的原位测量工作,对比研究离子种类对氟化锂材料辐照缺陷的...在BNU400注入机上搭建的离子激发发光(ion beam induced luminescence,IBIL)测量装置上,开展了相同能量(100 keV)条件下的3种离子(H^+、He^+以及O^+)辐照氟化锂材料时的IBIL光谱的原位测量工作,对比研究离子种类对氟化锂材料辐照缺陷的生成及其演变行为的影响.结合SRIM(Stopping and Range of Ions in Matter)模拟的结果,可以发现He^+辐照时的IBIL光谱强度最高,这是由于He^+激发产生的电子空穴对密度高于H^+,而O^+辐照时由于激发出的电子空穴对密度过高引起的非辐射复合比例增加,从而导致发光效率过低;质量数越大的离子辐照时,核阻止本领越大,会加快缺陷的生成和湮灭速率,降低达到平衡状态时的发光强度.近红外波段的F^-3/F^+2色心发光峰强度及其演变行为表明其耐辐照性能好于可见光波段的F2色心.展开更多
CVD diamond microdosimeter is an ideal substitute of common Si.GaAs detector for extremely strong radiation experimental environment due to its high band gap energy, fast charge collection, low dielectric constant and...CVD diamond microdosimeter is an ideal substitute of common Si.GaAs detector for extremely strong radiation experimental environment due to its high band gap energy, fast charge collection, low dielectric constant and hardness. In order to improve its character, a CVD diamond microdosimeter was irradiated by a proton dose of 46 Gy, and a lateral micro-ion beam induced charge (IBIC) technique was utilized to characterize it in low beam current (～fA). It was clearly shown that charge collection efficiency and energy resolution were greatly improved after proton irradiation of that dose. Moreover, the homogeneities of both its counting performance and collection efficiency were enhanced. Proton irradiation of 46 Gy has been proved to be an effective way to prime a CVD diamond.展开更多
基金Project supported by the Research Project of National University of Defense Technology,China(Grant No.JC13-02-14)the National Natural Science Foundation of China(Grant No.11104349)
文摘Focused ion-beam-induced deposition （FIBID） and focused electron-beam-induced deposition （FEBID） are conve- nient and useful in nanodevice fabrication. Since the deposition is from the organometallic platinum precursor, the con- ductive lines directly written by focused ion-beam （FIB） and focused electron-beam （FEB） are carbon-rich materials. We discuss an alternative approach to enhancing the platinum content and improving the conductivity of the conductive leads produced by FIBID and FEBID, namely an annealing treatment. Annealing in pure oxygen at 500 ℃ for 30 min enhances the platinum content values from ~ 18% to 30% and ~ 50% to 90% of FIBID and FEBID, respectively. Moreover, we find that thin films will be formed in the FIBID and FEBID processes. The annealing treatment is helpful to avoid the current leakage caused by these thin films. A single electron transistor is fabricated by FEBID and the current-voltage curve shows the Coulomb blockade effect.
文摘Negative ion-beam-induced luminescence (IBIL) measurements of a pure LiF crystal using 20 keV are performed to monitor the formation and annihilation of luminescence centers during ion irradiation. Several emission bands are observed in the IBIL spectra and the evolvement mechanisms of the corresponding centers are identified. The difference between the IBIL measurements using positive ions and negative ions is that the intensities of luminescence centers can reach the maxima at lower fluences under negative-ion irradiation due to free charge accumulation.
文摘在BNU400注入机上搭建的离子激发发光(ion beam induced luminescence,IBIL)测量装置上,开展了相同能量(100 keV)条件下的3种离子(H^+、He^+以及O^+)辐照氟化锂材料时的IBIL光谱的原位测量工作,对比研究离子种类对氟化锂材料辐照缺陷的生成及其演变行为的影响.结合SRIM(Stopping and Range of Ions in Matter)模拟的结果,可以发现He^+辐照时的IBIL光谱强度最高,这是由于He^+激发产生的电子空穴对密度高于H^+,而O^+辐照时由于激发出的电子空穴对密度过高引起的非辐射复合比例增加,从而导致发光效率过低;质量数越大的离子辐照时,核阻止本领越大,会加快缺陷的生成和湮灭速率,降低达到平衡状态时的发光强度.近红外波段的F^-3/F^+2色心发光峰强度及其演变行为表明其耐辐照性能好于可见光波段的F2色心.
文摘CVD diamond microdosimeter is an ideal substitute of common Si.GaAs detector for extremely strong radiation experimental environment due to its high band gap energy, fast charge collection, low dielectric constant and hardness. In order to improve its character, a CVD diamond microdosimeter was irradiated by a proton dose of 46 Gy, and a lateral micro-ion beam induced charge (IBIC) technique was utilized to characterize it in low beam current (～fA). It was clearly shown that charge collection efficiency and energy resolution were greatly improved after proton irradiation of that dose. Moreover, the homogeneities of both its counting performance and collection efficiency were enhanced. Proton irradiation of 46 Gy has been proved to be an effective way to prime a CVD diamond.
