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Optoelectronic properties of single-crystalline GaInAsSb quaternary alloy nanowires 被引量:1
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作者 李梦姿 陈新亮 +7 位作者 李洪来 张学红 祁朝阳 王晓霞 范鹏 张清林 朱小莉 庄秀娟 《Chinese Physics B》 SCIE EI CAS CSCD 2018年第7期543-547,共5页
Bandgap engineering of semiconductor nanomaterials is critical for their applications in nanoelectronics, opto- electronics, and photonics. Here we report, for the first time, the growth of single-crystalline quaterna... Bandgap engineering of semiconductor nanomaterials is critical for their applications in nanoelectronics, opto- electronics, and photonics. Here we report, for the first time, the growth of single-crystalline quaternary alloyed Ga0.75In0.25As0.49Sb0.51 nanowires via a chemical-vapor-deposition method. The synthesized nanowires have a uniform composition distribution along the growth direction, with a zinc-blende structure. In the photoluminescence investigation, these quaternary alloyed semiconductor nanowires show a strong band edge light emission at 1950 nm (0.636 eV). Photodetectors based on these alloy nanowires show a strong light response in the near-infrared region (980 nm) with the external quantum efficiency of 2.0 × 104% and the responsivity of 158 A/W. These novel near-infrared photodetectors may find promising applications in integrated infrared photodetection, information communication, and processing. 展开更多
关键词 galnassb nanowire quaternary alloy near-infrared photodetector
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扫描透射电镜对GalnAsSb/GaSb异质结截面的研究 被引量:1
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作者 张子旸 张宝林 +4 位作者 周天明 蒋红 金亿鑫 李树玮 F.Schulze-Kraasch 《功能材料》 CSCD 北大核心 2000年第5期505-507,共3页
报道了用STEM(扫描透射电子显微镜)对GaInAsSb/GaSb异质结的截面不同部分进行分析和研究的初步结果。STEM图像表明,在四元合金GaInAsSb与衬底GaSb的晶格常数不相同时,将会由于晶格的不匹配而产生失配位错和层错,这些缺陷是对应力的... 报道了用STEM(扫描透射电子显微镜)对GaInAsSb/GaSb异质结的截面不同部分进行分析和研究的初步结果。STEM图像表明,在四元合金GaInAsSb与衬底GaSb的晶格常数不相同时,将会由于晶格的不匹配而产生失配位错和层错,这些缺陷是对应力的一种释放形式,包括60°位错、90°位错和堆垛层错,并且发现只有90°位错才会在外延层表面产生脊。 展开更多
关键词 galnassb 位错 层错 STEM
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