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超宽禁带半导体Ga2O3微电子学研究进展 被引量:4
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作者 赵正平 《半导体技术》 CAS 北大核心 2019年第1期1-7,共7页
半导体材料Ga2O3是继宽禁带半导体材料SiC/GaN之后新兴的直接带隙超宽禁带氧化物半导体,其禁带宽度为4.5~4.9eV,击穿电场强度高达8MV/cm(是SiC及GaN的2倍以上),物理化学稳定性高,在发展下一代电力电子学和固态微波功率电子学领域具有较... 半导体材料Ga2O3是继宽禁带半导体材料SiC/GaN之后新兴的直接带隙超宽禁带氧化物半导体,其禁带宽度为4.5~4.9eV,击穿电场强度高达8MV/cm(是SiC及GaN的2倍以上),物理化学稳定性高,在发展下一代电力电子学和固态微波功率电子学领域具有较大的潜力。自2012年第一只Ga2O3场效应晶体管诞生以来,Ga2O3微电子学的研究呈现快速发展态势。本文综述了β-Ga2O3单晶材料和外延生长技术以及β-Ga2O3二极管和β-Ga2O3场效应管等方面的研究进展,介绍了β-Ga2O3材料和器件的新工艺、新器件结构以及性能测试结果,分析了相关技术难点和创新思路,展望了Ga2O3微电子学未来的发展趋势。 展开更多
关键词 ga2o3单晶 ga2o3外延 β-ga2o3肖特基二极管 β-ga2o3金属氧化物半导体场效应管(MoSFET) β-ga2o3鳍式场效应管(FinFET)
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Investigation of β-Ga_(2)O_(3) thick films grown on c-plane sapphire via carbothermal reduction
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作者 Liyuan Cheng Hezhi Zhang +1 位作者 Wenhui Zhang Hongwei Liang 《Journal of Semiconductors》 EI CAS CSCD 2023年第6期59-64,共6页
We investigated the influence of the growth temperature, O_(2) flow, molar ratio between Ga_(2)O_(3) powder and graphite powder on the structure and morphology of the films grown on the c-plane sapphire(0001) substrat... We investigated the influence of the growth temperature, O_(2) flow, molar ratio between Ga_(2)O_(3) powder and graphite powder on the structure and morphology of the films grown on the c-plane sapphire(0001) substrates by a carbothermal reduction method. Experimental results for the heteroepitaxial growth of β-Ga_(2)O_(3) illustrate that β-Ga_(2)O_(3) growth by the carbothermal reduction method can be controlled. The optimal result was obtained at a growth temperature of 1050 °C. The fastest growth rate of β-Ga_(2)O_(3) films was produced when the O_(2) flow was 20 sccm. To guarantee that β-Ga_(2)O_(3) films with both high-quality crystal and morphology properties, the ideal molar ratio between graphite powder and Ga_(2)O_(3) powder should be set at 10 : 1. 展开更多
关键词 β-ga_(2)o_(3)epitaxy carbothermal reduction method growth parameters
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Epitaxial growth ofβ-Ga_(2)O_(3)thin films on Ga_(2)O_(3)and Al_(2)O_(3)substrates by using pulsed laser deposition 被引量:2
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作者 Yuxin An Liyan Dai +9 位作者 Ying Wu Biao Wu Yanfei Zhao Tong Liu Hui Hao Zhengcheng Li Gang Niu Jinping Zhang Zhiyong Quan Sunan Dingy 《Journal of Advanced Dielectrics》 CAS 2019年第4期47-53,共7页
In this work,we have successfully grown high quality epitaxialβ-Ga_(2)O_(3)thin films onβ-Ga_(2)O_(3)(100)and Al_(2)O_(3)(0001)substrates using pulsed laser deposition(PLD).By optimizing temperature and oxygen press... In this work,we have successfully grown high quality epitaxialβ-Ga_(2)O_(3)thin films onβ-Ga_(2)O_(3)(100)and Al_(2)O_(3)(0001)substrates using pulsed laser deposition(PLD).By optimizing temperature and oxygen pressure,the best conditions were found to be 650-700℃and 0.5 Pa.To further improve the quality of hetero-epitaxialβ-Ga_(2)O_(3),the sapphire substrates were pretreated for atomic terraced surface by chemical cleaning and high temperature annealing.From the optical transmittance measurements,the films grown at 600-750℃exhibit a clear absorption edge at deep ultraviolet region around 250-275 nm wavelength.High resolution transmission electron microscope(HRTEM)images and X-ray diffraction(XRD)patterns demonstrate thatβ-Ga_(2)O_(3)(-201)//Al_(2)O_(3)(0001)epitaxial texture dominated the epitaxial oxide films on sapphire substrate,which opens up the possibilities of high power electric devices. 展开更多
关键词 oxide semiconductor β-ga_(2)o_(3)epitaxy optical transmission spectrum pulsed laser deposition crystal growth
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