目的制备15 nm的(AlCrTaTiZrMo)N六元高熵合金氮化物薄膜,并对其扩散阻挡性能进行表征。方法使用直流磁控溅射设备在单晶硅上沉积(Al Cr Ta Ti Zr Mo)N高熵合金氮化物薄膜,然后在薄膜上沉积150 nm的Cu,形成Cu/(AlCrTaTiZrMo)N/Si结构。...目的制备15 nm的(AlCrTaTiZrMo)N六元高熵合金氮化物薄膜,并对其扩散阻挡性能进行表征。方法使用直流磁控溅射设备在单晶硅上沉积(Al Cr Ta Ti Zr Mo)N高熵合金氮化物薄膜,然后在薄膜上沉积150 nm的Cu,形成Cu/(AlCrTaTiZrMo)N/Si结构。在600℃下,对该结构进行不同时间的退火处理,使用X射线衍射仪(XRD)、四探针测试仪(FPP)、原子力显微镜(AFM)和场发射扫描电子显微镜(FESEM)研究薄膜成分及退火时间对薄膜组织结构、表面形貌、方块电阻的影响,研究其扩散阻挡性。结果高熵合金氮化物薄膜与基体Si和Cu的结合性较好。沉积态高熵合金氮化物薄膜为非晶结构,表面光滑平整,方块电阻阻值较低。在600℃下经1h退火后,薄膜仍为非晶结构,表面发生粗化。随着退火时间增加,5h退火后,结构中出现少量纳米晶,大部分仍为非晶,表面粗糙度增加。退火7 h后,结构没有发生变化,仍为非晶包裹纳米晶结构,Cu表面生成部分岛状物,方块电阻阻值仍然较低,且无Cu-Si化合物生成,证明(AlCrTaTiZrMo)N高熵合金氮化物薄膜在长时间退火处理后,仍能保持良好的铜扩散阻挡性。结论 15nm的(AlCrTaTiZrMo)N高熵合金氮化物薄膜在600℃下退火7h后,其非晶包裹纳米晶的结构能有效阻挡Cu的扩散,表现出了优异的热稳定性与扩散阻挡性。展开更多
超大规模集成电路Cu互连中的核心技术之一是制备性能优异的扩散阻挡层。本文采用直流磁控反应溅射在N2/Ar气氛中制备了不同组分比的Ta-N薄膜,并原位制备了Cu/Ta-N/基底复合结构,对部分样品在N2保护下进行了快速热处理(RTA),采用台阶仪...超大规模集成电路Cu互连中的核心技术之一是制备性能优异的扩散阻挡层。本文采用直流磁控反应溅射在N2/Ar气氛中制备了不同组分比的Ta-N薄膜,并原位制备了Cu/Ta-N/基底复合结构,对部分样品在N2保护下进行了快速热处理(RTA),采用台阶仪、四探针测试仪、原子力显微镜(AFM)、扫描电镜、X射线衍射(XRD)对薄膜形貌结构进行了表征。结果表明,随着N2流量比的增加,薄膜沉积速率下降,表面趋于平滑,Ta-N薄膜热稳定性能及阻挡性能随之提高,而电阻率则上升。氮流量比为0.3制备的厚度为100nm的Ta-N薄膜经600℃/5m in RTA后,仍可保持对Cu的有效阻挡;在更高温度下退火,Cu将穿过阻挡层与Si发生反应,导致阻挡层失效。展开更多
Conductive fillers made from metal nanoparticles offer many advan-tages for the fabrication of a variety of electronic devices,but when they have a porous structure,their poor conductivity limits their adoption in man...Conductive fillers made from metal nanoparticles offer many advan-tages for the fabrication of a variety of electronic devices,but when they have a porous structure,their poor conductivity limits their adoption in many applications.In this study,an Ag-coated Cu micro-nanoparticle paste is used to achieve compact filling of blind vias on flexible copper clad polyimide laminates through a multistep filling and sintering tech-nique.The filled blind vias achieve a resistivity as low as 6.2μΩ·cm,which is comparable that of electroplated blind vias.Higher sintering pressure and temperature promote the filling performance,while the conductivity deteriorates at a via depth/diameter ratio greater than 1:1.Finite element simulations reveal a stress inhomogeneity in vias with large depth/diameter ratios,which is the key to understanding the evolution of the conductive properties of a paste-filled via.This study provides an effective method for high-performance microvia filling as well as insights into the mechanism that influences its performance.展开更多
文摘目的制备15 nm的(AlCrTaTiZrMo)N六元高熵合金氮化物薄膜,并对其扩散阻挡性能进行表征。方法使用直流磁控溅射设备在单晶硅上沉积(Al Cr Ta Ti Zr Mo)N高熵合金氮化物薄膜,然后在薄膜上沉积150 nm的Cu,形成Cu/(AlCrTaTiZrMo)N/Si结构。在600℃下,对该结构进行不同时间的退火处理,使用X射线衍射仪(XRD)、四探针测试仪(FPP)、原子力显微镜(AFM)和场发射扫描电子显微镜(FESEM)研究薄膜成分及退火时间对薄膜组织结构、表面形貌、方块电阻的影响,研究其扩散阻挡性。结果高熵合金氮化物薄膜与基体Si和Cu的结合性较好。沉积态高熵合金氮化物薄膜为非晶结构,表面光滑平整,方块电阻阻值较低。在600℃下经1h退火后,薄膜仍为非晶结构,表面发生粗化。随着退火时间增加,5h退火后,结构中出现少量纳米晶,大部分仍为非晶,表面粗糙度增加。退火7 h后,结构没有发生变化,仍为非晶包裹纳米晶结构,Cu表面生成部分岛状物,方块电阻阻值仍然较低,且无Cu-Si化合物生成,证明(AlCrTaTiZrMo)N高熵合金氮化物薄膜在长时间退火处理后,仍能保持良好的铜扩散阻挡性。结论 15nm的(AlCrTaTiZrMo)N高熵合金氮化物薄膜在600℃下退火7h后,其非晶包裹纳米晶的结构能有效阻挡Cu的扩散,表现出了优异的热稳定性与扩散阻挡性。
文摘超大规模集成电路Cu互连中的核心技术之一是制备性能优异的扩散阻挡层。本文采用直流磁控反应溅射在N2/Ar气氛中制备了不同组分比的Ta-N薄膜,并原位制备了Cu/Ta-N/基底复合结构,对部分样品在N2保护下进行了快速热处理(RTA),采用台阶仪、四探针测试仪、原子力显微镜(AFM)、扫描电镜、X射线衍射(XRD)对薄膜形貌结构进行了表征。结果表明,随着N2流量比的增加,薄膜沉积速率下降,表面趋于平滑,Ta-N薄膜热稳定性能及阻挡性能随之提高,而电阻率则上升。氮流量比为0.3制备的厚度为100nm的Ta-N薄膜经600℃/5m in RTA后,仍可保持对Cu的有效阻挡;在更高温度下退火,Cu将穿过阻挡层与Si发生反应,导致阻挡层失效。
基金This work was supported by the National Key R&D Program of China(2018YFE0204601),the National Natural Science Foundation of China[61874155,62174039]Key-area Research and Development Program of Guangdong Province[2021B0101290001,2020B0101290001]+1 种基金Open Project of the State Key Laboratory of Advanced Materials and Electronic Components[FHR-JS-202011005]Guangdong Basic and Applied Basic Research[2021A1515011642,2021A1515110656,2022A1515010141].
文摘Conductive fillers made from metal nanoparticles offer many advan-tages for the fabrication of a variety of electronic devices,but when they have a porous structure,their poor conductivity limits their adoption in many applications.In this study,an Ag-coated Cu micro-nanoparticle paste is used to achieve compact filling of blind vias on flexible copper clad polyimide laminates through a multistep filling and sintering tech-nique.The filled blind vias achieve a resistivity as low as 6.2μΩ·cm,which is comparable that of electroplated blind vias.Higher sintering pressure and temperature promote the filling performance,while the conductivity deteriorates at a via depth/diameter ratio greater than 1:1.Finite element simulations reveal a stress inhomogeneity in vias with large depth/diameter ratios,which is the key to understanding the evolution of the conductive properties of a paste-filled via.This study provides an effective method for high-performance microvia filling as well as insights into the mechanism that influences its performance.
