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Optical study of Ba(Mn_xTi_(1-x)O_3) thin films by spectroscopic ellipsometry
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作者 张婷 殷江 +1 位作者 丁玲红 张伟风 《Chinese Physics B》 SCIE EI CAS CSCD 2013年第11期589-593,共5页
Stoichiometric Ba(MnxTi(1-x)O3) (BMT) thin films with various values of x were deposited on Si(111) substrates by the sol-gel technique. The influence of Mn content on the optical properties was studied by spe... Stoichiometric Ba(MnxTi(1-x)O3) (BMT) thin films with various values of x were deposited on Si(111) substrates by the sol-gel technique. The influence of Mn content on the optical properties was studied by spectroscopic ellipsometry (SE) in the UV–Vis–NIR region. By fitting the measured ellipsometric parameter (Ψ and Δ) with a four-phase model (air/BMT+voids/BMT/Si(111)), the key optical constants of the thin films have been obtained. It was found that the refractive index n and the extinction coefficient k increase with increasing Mn content due to the increase in the packing density. Furthermore, a strong dependence of the optical band gap Eg on Mn/Ti ratios in the deposited films was observed, and it was inferred that the energy level of conduction bands decreases with increasing Mn content. 展开更多
关键词 bamnxti(1-xo3) (BMT) thin films spectroscopic ellipsometry refractive index extinction co-efficient
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