The thermal expansion coefficients (TEC) of RuO2 crystallits in thick film resistor (TFR) composites, consisting of RuO2 dispersed in lead-silicate glass of various compositions, were evaluated from X-ray diffraction ...The thermal expansion coefficients (TEC) of RuO2 crystallits in thick film resistor (TFR) composites, consisting of RuO2 dispersed in lead-silicate glass of various compositions, were evaluated from X-ray diffraction patterns at temperatures 298;773;973 and 1123 K corresponding to characteristic temperatures of resistivity and thermopower anomalies of the TFRs. It has been found that TEC of free RuO2 powder along a-axis has an anomaly at T > 973 K (expansion is replaced by constriction), whereas constriction along c-axes remains for all temperatures. This anomaly disappears in doped glass of simplest composition (2SiO2.PbO) but occurs in glasses of some complex compositions. Symmetry of unit cell of RuO2 is not changed in the temperature range investigated.展开更多
文摘The thermal expansion coefficients (TEC) of RuO2 crystallits in thick film resistor (TFR) composites, consisting of RuO2 dispersed in lead-silicate glass of various compositions, were evaluated from X-ray diffraction patterns at temperatures 298;773;973 and 1123 K corresponding to characteristic temperatures of resistivity and thermopower anomalies of the TFRs. It has been found that TEC of free RuO2 powder along a-axis has an anomaly at T > 973 K (expansion is replaced by constriction), whereas constriction along c-axes remains for all temperatures. This anomaly disappears in doped glass of simplest composition (2SiO2.PbO) but occurs in glasses of some complex compositions. Symmetry of unit cell of RuO2 is not changed in the temperature range investigated.
