An improved interface characterization technique for a full-range profiling of oxide damage in ultra-thin gate oxide CMOS devices；An intelligent system for advanced dynamic security assessment；Ancient raw copper fro...An improved interface characterization technique for a full-range profiling of oxide damage in ultra-thin gate oxide CMOS devices；An intelligent system for advanced dynamic security assessment；Ancient raw copper from primary smelting sites in Cyprus;Anthropogenic plutonium in soils of the Ural展开更多
文摘An improved interface characterization technique for a full-range profiling of oxide damage in ultra-thin gate oxide CMOS devices；An intelligent system for advanced dynamic security assessment；Ancient raw copper from primary smelting sites in Cyprus;Anthropogenic plutonium in soils of the Ural
