Y2001-62791-237 0118435自加热及接触电阻对 nMOSFETs 影响的模拟=Simu-lation of self-heating and contact resistance influences onnMOSFETs[会,英]/Matsuzawa.K.& Kawashima,H.//2000 IEEE International Conference on Simul...Y2001-62791-237 0118435自加热及接触电阻对 nMOSFETs 影响的模拟=Simu-lation of self-heating and contact resistance influences onnMOSFETs[会,英]/Matsuzawa.K.& Kawashima,H.//2000 IEEE International Conference on Simulationof Semiconductor Processes and Devices.—237~240(EC)展开更多
文摘Y2001-62791-237 0118435自加热及接触电阻对 nMOSFETs 影响的模拟=Simu-lation of self-heating and contact resistance influences onnMOSFETs[会,英]/Matsuzawa.K.& Kawashima,H.//2000 IEEE International Conference on Simulationof Semiconductor Processes and Devices.—237~240(EC)