Y2001-62838-39 0117378以所选节点电压加/减法为基础的新机内自测技术=New built-in self-test technique based on addition/sub-traction of selected node voltage[会,英]/Ko,K.Y.&Wong,M.W.T.//Proceedings of the Ninth Asian...Y2001-62838-39 0117378以所选节点电压加/减法为基础的新机内自测技术=New built-in self-test technique based on addition/sub-traction of selected node voltage[会,英]/Ko,K.Y.&Wong,M.W.T.//Proceedings of the Ninth AsianTest Symposium(ATS 2000).—39~43(PC)介绍一种新的机内自测(BIST)技术,它可利用电路节点电压的小预选集加/减法而在硬件开销小于电压扫描法的情况下达到高故障检测与定位率。描述了该测试技术的工作原理和试验证明。展开更多
文摘Y2001-62838-39 0117378以所选节点电压加/减法为基础的新机内自测技术=New built-in self-test technique based on addition/sub-traction of selected node voltage[会,英]/Ko,K.Y.&Wong,M.W.T.//Proceedings of the Ninth AsianTest Symposium(ATS 2000).—39~43(PC)介绍一种新的机内自测(BIST)技术,它可利用电路节点电压的小预选集加/减法而在硬件开销小于电压扫描法的情况下达到高故障检测与定位率。描述了该测试技术的工作原理和试验证明。