TL632.1 20010532381.06 μm波段大口径无规位相板制作与性能测试=Fabrication and performance measurement of a large aperture random phase p1ate at 1.06 μm wavelength[刊,中]/黄惠杰,路敦武,王润文,赵永凯,刘增水(中科院上海...TL632.1 20010532381.06 μm波段大口径无规位相板制作与性能测试=Fabrication and performance measurement of a large aperture random phase p1ate at 1.06 μm wavelength[刊,中]/黄惠杰,路敦武,王润文,赵永凯,刘增水(中科院上海光机所.上海(201800))//强激光与粒子束.—2000,12(1),—55-57利用大面积光刻和腐蚀等工艺。展开更多
TN29 99021237用超高速光电采样技术研究半导体微波器件时域特性和频域特性=Study of time—domain and frequency—domain characterization of microwavesemiconductor devices by ultrafast optoelectronicsampling technique[刊,中]...TN29 99021237用超高速光电采样技术研究半导体微波器件时域特性和频域特性=Study of time—domain and frequency—domain characterization of microwavesemiconductor devices by ultrafast optoelectronicsampling technique[刊,中]/潘家齐,袁树忠,吕福云,范万德,王劲松(南开大学电子科学系.天津(300071))//半导体学报.—1998,(2).展开更多
文摘TL632.1 20010532381.06 μm波段大口径无规位相板制作与性能测试=Fabrication and performance measurement of a large aperture random phase p1ate at 1.06 μm wavelength[刊,中]/黄惠杰,路敦武,王润文,赵永凯,刘增水(中科院上海光机所.上海(201800))//强激光与粒子束.—2000,12(1),—55-57利用大面积光刻和腐蚀等工艺。
文摘TN29 99021237用超高速光电采样技术研究半导体微波器件时域特性和频域特性=Study of time—domain and frequency—domain characterization of microwavesemiconductor devices by ultrafast optoelectronicsampling technique[刊,中]/潘家齐,袁树忠,吕福云,范万德,王劲松(南开大学电子科学系.天津(300071))//半导体学报.—1998,(2).
