The decoding algorithms of two-dimensional Vernier anodes are deduced theoretically.The precision of decoding and uniqueness of encoding are proved.The influencing factors of detection sensitivity and spatial resoluti...The decoding algorithms of two-dimensional Vernier anodes are deduced theoretically.The precision of decoding and uniqueness of encoding are proved.The influencing factors of detection sensitivity and spatial resolution are discussed.The single photon imaging system is constructed,and the two-dimensional Vernier collector is fabricated.The image of the ultra-weak emission source is reconstructed.The spatial resolution of the system is about 100μm.展开更多
In this paper, the distribution of the phase deviations for the ghosting of Vernier based imagers is provided. The equality of the phase errors is shown. The relationship between the charge noise amplitude of electrod...In this paper, the distribution of the phase deviations for the ghosting of Vernier based imagers is provided. The equality of the phase errors is shown. The relationship between the charge noise amplitude of electrodes and the total charge noise amplitude is provided. The relationship between the phase error and the total charge noise amplitude is also provided, which reveals the magnitude of 10 4 electrons for the ghosting occurrence threshold for the 4-coarse-pixel anode imagers.展开更多
基金supported by the National Natural Science Foundation of China (Grant No. 10878005/A03)
文摘The decoding algorithms of two-dimensional Vernier anodes are deduced theoretically.The precision of decoding and uniqueness of encoding are proved.The influencing factors of detection sensitivity and spatial resolution are discussed.The single photon imaging system is constructed,and the two-dimensional Vernier collector is fabricated.The image of the ultra-weak emission source is reconstructed.The spatial resolution of the system is about 100μm.
基金the National Natural Science Foundations of China (Grant Nos. 10878005/A03 and 61007017)
文摘In this paper, the distribution of the phase deviations for the ghosting of Vernier based imagers is provided. The equality of the phase errors is shown. The relationship between the charge noise amplitude of electrodes and the total charge noise amplitude is provided. The relationship between the phase error and the total charge noise amplitude is also provided, which reveals the magnitude of 10 4 electrons for the ghosting occurrence threshold for the 4-coarse-pixel anode imagers.
