As develops in deep sub micron designs,the interconnect crosstalk becomes much more serious.Espe cially, the coupling inductance can not be ignored in gigahertz designs.So shield insertion is an efficient techniq...As develops in deep sub micron designs,the interconnect crosstalk becomes much more serious.Espe cially, the coupling inductance can not be ignored in gigahertz designs.So shield insertion is an efficient technique to reduce the inductive noise.In this paper,the characteristics of on chip mutual inductance (as well as self) for coplanar,micro stripline and stripline structures are introduced first.Then base on the coplanar interconnect structures,the effective coupling K eff model and the RLC explicit noise model are proposed respectively.The results of experiments show that these two models both have high fidelity.展开更多
Based on the 65nm CMOS process,a novel parallel RLC coupling interconnect analytical model is presented synthetically considering parasitical capacitive and parasitical inductive effects. Applying function approximati...Based on the 65nm CMOS process,a novel parallel RLC coupling interconnect analytical model is presented synthetically considering parasitical capacitive and parasitical inductive effects. Applying function approximation and model order-reduction to the model, we derive a closed-form and time-domain waveform for the far-end crosstalk of a victim line under ramp input transition. For various interconnect coupling sizes, the proposed RLC coupling analytical model enables the estimation of the crosstalk voltage within 2.50% error compared with Hspice simulation in a 65nm CMOS process. This model can be used in computer-aided-design of nanometer SOCs.展开更多
文摘As develops in deep sub micron designs,the interconnect crosstalk becomes much more serious.Espe cially, the coupling inductance can not be ignored in gigahertz designs.So shield insertion is an efficient technique to reduce the inductive noise.In this paper,the characteristics of on chip mutual inductance (as well as self) for coplanar,micro stripline and stripline structures are introduced first.Then base on the coplanar interconnect structures,the effective coupling K eff model and the RLC explicit noise model are proposed respectively.The results of experiments show that these two models both have high fidelity.
文摘Based on the 65nm CMOS process,a novel parallel RLC coupling interconnect analytical model is presented synthetically considering parasitical capacitive and parasitical inductive effects. Applying function approximation and model order-reduction to the model, we derive a closed-form and time-domain waveform for the far-end crosstalk of a victim line under ramp input transition. For various interconnect coupling sizes, the proposed RLC coupling analytical model enables the estimation of the crosstalk voltage within 2.50% error compared with Hspice simulation in a 65nm CMOS process. This model can be used in computer-aided-design of nanometer SOCs.