This paper presents a large field phase-shifting interference microscope for micro-surface topography measurement.A PZT is used as the Z-directional phase shifter.The interference microscope is the combination of the ...This paper presents a large field phase-shifting interference microscope for micro-surface topography measurement.A PZT is used as the Z-directional phase shifter.The interference microscope is the combination of the infinity tube microscope with the Mirau two-beam interferometer.Two-dimensional precision motorized stage is aligned as the scanning system in the X-and Y-direction to extend the test surface measurement range to 12.5 mm ×12.5 mm.The minimum displacement is 0.039 μm and the overlapped proportion is 0.22.A fast stitching algorithm is proposed based on grid matching.According to the reflectivity of the core and the ferrule,the plate with the transmission/reflectivity ratio of 70/30 is selected to balance the interference intensity.The instrument is proved to be valid by actual measurement of the end surface of an optical fiber connector.展开更多
Arc erosion morphologies of Ag/MeO（10） electrical contact materials after 50000 operations under direct current of 19 V and 20 A and resistive load conditions were investigated using scanning electron microscope（SE...Arc erosion morphologies of Ag/MeO（10） electrical contact materials after 50000 operations under direct current of 19 V and 20 A and resistive load conditions were investigated using scanning electron microscope（SEM） and a 3D optical profiler（3DOP）. The results indicated that 3DOP could supply clearer and more detailed arc erosion morphology information. Arc erosion resistance of Ag/SnO_2（10） electrical contact material was the best and that of Ag/CuO（10） was the worst. Arc erosion morphology of Ag/MeO（10） electrical contact materials mainly included three different types. Arc erosion morphologies of Ag/ZnO（10） and Ag/SnO_2（10） electrical contact materials were mainly liquid splash and evaporation, and those of Ag/CuO（10） and Ag/CdO（10） were mainly material transfer from anode to cathode. Arc erosion morphology of Ag/SnO_2（6）In_2O_3（4） electrical contact materials included both liquid splash, evaporation and material transfer. In addition, the formation process and mechanism on arc erosion morphology of Ag/MeO（10） electrical contact materials were discussed.展开更多
SPIE-Vol.3784 01163711999年SPIE会议录,Vol.3784:粗糙表面散射与污染=1999 proceedings of SPIE,Vol.3784:Rough surfacescattering and contamination[会,英]/SPIE-The Interna-tional Society for Optical Engineering.—1999.—404...SPIE-Vol.3784 01163711999年SPIE会议录,Vol.3784:粗糙表面散射与污染=1999 proceedings of SPIE,Vol.3784:Rough surfacescattering and contamination[会,英]/SPIE-The Interna-tional Society for Optical Engineering.—1999.—404P.(EC)本会议录收集了于1999年7月21～23日在科罗拉多州Denver召开的粗糙表面散射与污染会议上发表的39篇论文,内容涉及航天器污染控制,监测与测量技术,表面粗糙度测量,散射理论与分析,斑点互作用与散射测量,表面缺陷散射微分强度探测,非接触高精确表面三维轮廓仪,沥青质光谱研究。Y2001-62801 01163722000年IEEE地球科学与遥感国际会议录,卷1=2000 IEEE international geoscience and remote sensingsymposium,Vol.1 of 7[会,英]/IEEE Geoscience andRemote Sensing Society.—IEEE,2000.—450P.(EC)展开更多
基金supported by the National Natural Science Foundation of China (No.60577013)New Teachers Doctoral Fund of Ministry of Education of China (200800561022)
文摘This paper presents a large field phase-shifting interference microscope for micro-surface topography measurement.A PZT is used as the Z-directional phase shifter.The interference microscope is the combination of the infinity tube microscope with the Mirau two-beam interferometer.Two-dimensional precision motorized stage is aligned as the scanning system in the X-and Y-direction to extend the test surface measurement range to 12.5 mm ×12.5 mm.The minimum displacement is 0.039 μm and the overlapped proportion is 0.22.A fast stitching algorithm is proposed based on grid matching.According to the reflectivity of the core and the ferrule,the plate with the transmission/reflectivity ratio of 70/30 is selected to balance the interference intensity.The instrument is proved to be valid by actual measurement of the end surface of an optical fiber connector.
基金Project(2012QNZT003)supported by the Fundamental Research Funds for the Central Universities,ChinaProject(2012M521542)supported by the Postdoctoral Science Foundation of China+1 种基金Project(14JJ3014)supported by the Hunan Provincial Natural Science Foundation of ChinaProject(BSh1202)supported by the Zhejiang Provincial Postdoctoral Scientific Research Foundation of China
文摘Arc erosion morphologies of Ag/MeO（10） electrical contact materials after 50000 operations under direct current of 19 V and 20 A and resistive load conditions were investigated using scanning electron microscope（SEM） and a 3D optical profiler（3DOP）. The results indicated that 3DOP could supply clearer and more detailed arc erosion morphology information. Arc erosion resistance of Ag/SnO_2（10） electrical contact material was the best and that of Ag/CuO（10） was the worst. Arc erosion morphology of Ag/MeO（10） electrical contact materials mainly included three different types. Arc erosion morphologies of Ag/ZnO（10） and Ag/SnO_2（10） electrical contact materials were mainly liquid splash and evaporation, and those of Ag/CuO（10） and Ag/CdO（10） were mainly material transfer from anode to cathode. Arc erosion morphology of Ag/SnO_2（6）In_2O_3（4） electrical contact materials included both liquid splash, evaporation and material transfer. In addition, the formation process and mechanism on arc erosion morphology of Ag/MeO（10） electrical contact materials were discussed.
文摘SPIE-Vol.3784 01163711999年SPIE会议录,Vol.3784:粗糙表面散射与污染=1999 proceedings of SPIE,Vol.3784:Rough surfacescattering and contamination[会,英]/SPIE-The Interna-tional Society for Optical Engineering.—1999.—404P.(EC)本会议录收集了于1999年7月21～23日在科罗拉多州Denver召开的粗糙表面散射与污染会议上发表的39篇论文,内容涉及航天器污染控制,监测与测量技术,表面粗糙度测量,散射理论与分析,斑点互作用与散射测量,表面缺陷散射微分强度探测,非接触高精确表面三维轮廓仪,沥青质光谱研究。Y2001-62801 01163722000年IEEE地球科学与遥感国际会议录,卷1=2000 IEEE international geoscience and remote sensingsymposium,Vol.1 of 7[会,英]/IEEE Geoscience andRemote Sensing Society.—IEEE,2000.—450P.(EC)
