Surface charges greatly affect the discharge/flashover development process across an insulator. The relationship between surface charge distribution on insulating materials and measurement data based on Pockels techni...Surface charges greatly affect the discharge/flashover development process across an insulator. The relationship between surface charge distribution on insulating materials and measurement data based on Pockels technique is discussed, and an improved algorithm is built to calculate the real surface charge density from original data. In this algorithm, two-dimensional Fourier transform technique and Wiener filter are employed to reduce the amount of numerical calculation and improve the stability of computation, Moreover, this algorithm considers not only the influence of sample＇s thickness and permittivity, but also the impact of charges at different positions. The achievement of this calibration algorithm is demonstrated in details. Compared with traditional algorithms, the improved one supplies a better solution in the calibration of surface charge distribution on different samples with different thickness.展开更多
基金supported in part by National Natural Science Foundation of China(Nos.50937004,50777051)
文摘Surface charges greatly affect the discharge/flashover development process across an insulator. The relationship between surface charge distribution on insulating materials and measurement data based on Pockels technique is discussed, and an improved algorithm is built to calculate the real surface charge density from original data. In this algorithm, two-dimensional Fourier transform technique and Wiener filter are employed to reduce the amount of numerical calculation and improve the stability of computation, Moreover, this algorithm considers not only the influence of sample＇s thickness and permittivity, but also the impact of charges at different positions. The achievement of this calibration algorithm is demonstrated in details. Compared with traditional algorithms, the improved one supplies a better solution in the calibration of surface charge distribution on different samples with different thickness.
