随着集成电路技术快速发展,芯片的集成度和密度越来越大,体积和功耗越来越小,IC领域提出了一种新型的超摩尔定律的芯片设计思路——系统级封装(System in Package,SiP)。要在有限的芯片管脚下完成对整个SiP电路系统的测试变得极具挑战,...随着集成电路技术快速发展,芯片的集成度和密度越来越大,体积和功耗越来越小,IC领域提出了一种新型的超摩尔定律的芯片设计思路——系统级封装(System in Package,SiP)。要在有限的芯片管脚下完成对整个SiP电路系统的测试变得极具挑战,急需寻求一种新的测试方法。为此,文中提出了一种基于边界扫描测试方法,在严格遵循紧凑性和完备性的指标下,通过对现有自适应算法中快速生成测试矩阵算法的优化,完成SiP芯片的互连测试。对比分析优化前后各算法的混淆率和紧凑性指标,验证了使用低权值的等权值算法能有效地提高测试的性能。测试的仿真结果表明,基于边界扫描测试的低权值的等权值算法可以满足SiP的测试需求。展开更多
Content addressable memory （CAM） is widely used and its tests mostly use functional fault models. However, functional fault models cannot describe some physical faults exactly. This paper introduces physical fault m...Content addressable memory （CAM） is widely used and its tests mostly use functional fault models. However, functional fault models cannot describe some physical faults exactly. This paper introduces physical fault models for write-only CAM. Two test algorithms which can cover 100% targeted physical faults are also proposed. The algorithm for a CAM module with N-bit match output signal needs only 2N＋2L＋4 comparison operations and 5N writing operations, where N is the number of words and L is the word length. The algorithm for a HIT-signal-only CAM module uses 2N＋2L＋5 comparison operations and 8N writing operations. Compared to previous work, the proposed algorithms can test more physical faults with a few more operations. An experiment on a test chip shows the effectiveness and efficiency of the proposed physical fault models and algorithms.展开更多
基金Project supported by the Natural Science Foundation of China(No.60572093)Specialized Research Fund for the Doctoral Program of Higher Education of China(No.20050004016)NSFC-KOSEF Joint Research Project and IITA Professorship Program of Gwangju Instiute of Science and Technology
文摘随着集成电路技术快速发展,芯片的集成度和密度越来越大,体积和功耗越来越小,IC领域提出了一种新型的超摩尔定律的芯片设计思路——系统级封装(System in Package,SiP)。要在有限的芯片管脚下完成对整个SiP电路系统的测试变得极具挑战,急需寻求一种新的测试方法。为此,文中提出了一种基于边界扫描测试方法,在严格遵循紧凑性和完备性的指标下,通过对现有自适应算法中快速生成测试矩阵算法的优化,完成SiP芯片的互连测试。对比分析优化前后各算法的混淆率和紧凑性指标,验证了使用低权值的等权值算法能有效地提高测试的性能。测试的仿真结果表明,基于边界扫描测试的低权值的等权值算法可以满足SiP的测试需求。
基金supported by the National Natural Science Foundation of China (No.60603049)the National High Technology Research and Development Program of China (Nos.2008AA110901,2007AA01Z112,2009AA01Z125)+1 种基金the State Key Development Program for Basic Research of China (No.2005CB321600)the Beijing Natural Science Foundation (No.4072024)
文摘Content addressable memory （CAM） is widely used and its tests mostly use functional fault models. However, functional fault models cannot describe some physical faults exactly. This paper introduces physical fault models for write-only CAM. Two test algorithms which can cover 100% targeted physical faults are also proposed. The algorithm for a CAM module with N-bit match output signal needs only 2N＋2L＋4 comparison operations and 5N writing operations, where N is the number of words and L is the word length. The algorithm for a HIT-signal-only CAM module uses 2N＋2L＋5 comparison operations and 8N writing operations. Compared to previous work, the proposed algorithms can test more physical faults with a few more operations. An experiment on a test chip shows the effectiveness and efficiency of the proposed physical fault models and algorithms.
