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Interface reactions in film materials
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作者 Fengwu Zhu, Zhonghai Thai, and Guanghua YuMaterials Science and Engineering School, University of Science and Technology Beijing, Beijing 100083, China 《Journal of University of Science and Technology Beijing》 CSCD 2003年第5期1-8,共8页
Interface reaction (IR) is a frequently observed phenomenon in the study ofadvanced thin film materials. It is very important to study the reaction conditions at which IRhappens and then to suppress or make use of it,... Interface reaction (IR) is a frequently observed phenomenon in the study ofadvanced thin film materials. It is very important to study the reaction conditions at which IRhappens and then to suppress or make use of it, the necessary conditions, including boththermodynamical and dynamical conditions of IR were discussed in detail. IRs in various systems,including oxide/silicon, oxide/metal, metal/metal, metal/semiconductor andsemiconductor/semiconductor, were reviewed. Methods to suppress and make use of IR were alsointroduced. 展开更多
关键词 interface reaction spin-valve multilayers gate dielectric
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Ta/NiFe/Cu/NiFe/FeMn/Ta自旋阀多层膜的X射线光电子能谱的研究
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作者 于广华 李明华 朱逢吾 《真空电子技术》 2003年第5期42-45,共4页
 实验表明Ta NiFe FeMn Ta多层膜的交换耦合场(Hex)要大于Ta NiFe Cu NiFe FeMn Ta自旋阀多层膜中的Hex。为了寻找其原因,用X射线光电子能谱(XPS)研究了Ta(12nm) NiFe(7nm),Ta(12nm) NiFe(7nm) Cu(4nm)和Ta(12nm) NiFe(7nm) Cu(3nm) Ni...  实验表明Ta NiFe FeMn Ta多层膜的交换耦合场(Hex)要大于Ta NiFe Cu NiFe FeMn Ta自旋阀多层膜中的Hex。为了寻找其原因,用X射线光电子能谱(XPS)研究了Ta(12nm) NiFe(7nm),Ta(12nm) NiFe(7nm) Cu(4nm)和Ta(12nm) NiFe(7nm) Cu(3nm) NiFe(5nm)3种样品,研究结果表明,前两种样品表面无任何来自下层的元素偏聚;但在第3种样品最上层的NiFe表面上,探测到从下层偏聚上来的Cu原子。我们认为:Cu在NiFe FeMn层间的存在是Ta NiFe Cu NiFe FeMn Ta自旋阀多层膜的Hex低于Ta NiFe FeMn Ta多层膜Hex的一个重要原因。 展开更多
关键词 自旋阀多层膜 交换耦合场 层间偏聚 X射线光电子能谱
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