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Correlated barrier hopping of CuO nanoparticles
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作者 Jiji Koshy Soosen Samuel.M +1 位作者 Anoop Chandran K.C.George 《Journal of Semiconductors》 EI CAS CSCD 2015年第12期24-29,共6页
The ac conduction mechanism in copper oxide nanoparticles with 8 nm size, synthesized by a precipitation method was studied by analyzing ac conductivity in the frequency range of 50 Hz-1 MHz and in the temperature ran... The ac conduction mechanism in copper oxide nanoparticles with 8 nm size, synthesized by a precipitation method was studied by analyzing ac conductivity in the frequency range of 50 Hz-1 MHz and in the temperature range of 373-573 K. X-ray diffraction and transmission electron microscopy (TEM) were employed for the structural and morphological characterization of CuO nanoparticles. The experimental and theoretical in- vestigations suggested that the ac conduction mechanism in CuO nanoparticles can be successfully explained by a correlated barrier hopping model, which provided reasonable values for the maximum barrier height and characteristic relaxation time. It was also found that bipolaron hopping become prominent up to a particular temperature and beyond that single polaron hopping predominates. Physical parameters such as hopping distance and density of defect states were also calculated. Photoluminescence studies confirm the presence of a surface defect in CuO nanoparticles. 展开更多
关键词 CuO nanoparticles correlated barrier hopping defect states photoluminescence spectrum single polaron hopping
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