A Bayesian sequential testing method is proposed to evaluate system reliability index with reliability growth during development.The method develops a reliability growth model of repairable systems for failure censore...A Bayesian sequential testing method is proposed to evaluate system reliability index with reliability growth during development.The method develops a reliability growth model of repairable systems for failure censored test,and figures out the approach to determine the prior distribution of the system failure rate by applying the reliability growth model to incorporate the multistage test data collected from system development.Furthermore,the procedure for the Bayesian sequential testing is derived for the failure rate of the exponential life system,which enables the decision to terminate or continue development test.Finally,a numerical example is given to illustrate the efficiency of the proposed model and procedure.展开更多
Suppose that X has density f(x,θ)=exp(θx-ψ(θ)} (with respect to some measure v),where θ∈(θ,θ),∞≤θ≤+∞.Consider the problem of testing the hypothesis θ≤θ0 against θ≥θ1 for some given θ0 and θ1 (θ&...Suppose that X has density f(x,θ)=exp(θx-ψ(θ)} (with respect to some measure v),where θ∈(θ,θ),∞≤θ≤+∞.Consider the problem of testing the hypothesis θ≤θ0 against θ≥θ1 for some given θ0 and θ1 (θ<θ0<θ1<θ).A class of truncated sequential tests is introduced with type Ⅰ and type Ⅱ error probabilities not exceeding a and β,respectively.The expected sample sizes of these tests are shown to be asymptotically minimal for all θ as α+β↓0展开更多
为了维持无线传感器网络的正常运行,所有的故障链路需要被精确定位。将该问题转换为基于端到端的数据引导,以减少主动监测次数为目的的最优监测序列的问题。提出了通过拓扑拆分得到故障子图,并通过子图的概率集进一步计算节省主动探测...为了维持无线传感器网络的正常运行,所有的故障链路需要被精确定位。将该问题转换为基于端到端的数据引导,以减少主动监测次数为目的的最优监测序列的问题。提出了通过拓扑拆分得到故障子图,并通过子图的概率集进一步计算节省主动探测次数的基于节点监测多条链路的启发式贪婪算法NTHG(node testing using heuristic greedy)。仿真结果表明仅需要监测小部分的节点,就可以定位网络中所有的故障链路。与该问题最新的解决算法LTHG(link testing using heristic greedy)相比,新算法需要更少的监测次数和平均CPU耗时,从而很好地降低了网络能耗,缩短了故障定位耗时。展开更多
针对可靠性增长下的序贯检验分析问题,提出了一种变总体Bayes序贯检验方法.该方法依据产品研制过程中产生的多状态试验数据,利用离散AMSAA(Army Material Systems Analysis Activity)可靠性增长模型对产品可靠性的变化规律进行描述,给...针对可靠性增长下的序贯检验分析问题,提出了一种变总体Bayes序贯检验方法.该方法依据产品研制过程中产生的多状态试验数据,利用离散AMSAA(Army Material Systems Analysis Activity)可靠性增长模型对产品可靠性的变化规律进行描述,给出了变总体试验数据似然函数的表达式,并对变总体Bayes序贯检验的后验概率比和决策阈值进行了定义,进而构建了可靠性增长下的Bayes序贯检验模型.研究结果表明,提出的方法有效地解决了具有可靠性增长的可靠性指标的假设检验问题.展开更多
基金supported by the National Natural Science Foundation of China (70571083)the Research Fund for the Doctoral Program of Higher Education of China (20094307110013)
文摘A Bayesian sequential testing method is proposed to evaluate system reliability index with reliability growth during development.The method develops a reliability growth model of repairable systems for failure censored test,and figures out the approach to determine the prior distribution of the system failure rate by applying the reliability growth model to incorporate the multistage test data collected from system development.Furthermore,the procedure for the Bayesian sequential testing is derived for the failure rate of the exponential life system,which enables the decision to terminate or continue development test.Finally,a numerical example is given to illustrate the efficiency of the proposed model and procedure.
基金Project supported by the National Natural Science Foundation of China and a Hong Kong UPGC-RGC grant.
文摘Suppose that X has density f(x,θ)=exp(θx-ψ(θ)} (with respect to some measure v),where θ∈(θ,θ),∞≤θ≤+∞.Consider the problem of testing the hypothesis θ≤θ0 against θ≥θ1 for some given θ0 and θ1 (θ<θ0<θ1<θ).A class of truncated sequential tests is introduced with type Ⅰ and type Ⅱ error probabilities not exceeding a and β,respectively.The expected sample sizes of these tests are shown to be asymptotically minimal for all θ as α+β↓0
文摘为了维持无线传感器网络的正常运行,所有的故障链路需要被精确定位。将该问题转换为基于端到端的数据引导,以减少主动监测次数为目的的最优监测序列的问题。提出了通过拓扑拆分得到故障子图,并通过子图的概率集进一步计算节省主动探测次数的基于节点监测多条链路的启发式贪婪算法NTHG(node testing using heuristic greedy)。仿真结果表明仅需要监测小部分的节点,就可以定位网络中所有的故障链路。与该问题最新的解决算法LTHG(link testing using heristic greedy)相比,新算法需要更少的监测次数和平均CPU耗时,从而很好地降低了网络能耗,缩短了故障定位耗时。
文摘针对可靠性增长下的序贯检验分析问题,提出了一种变总体Bayes序贯检验方法.该方法依据产品研制过程中产生的多状态试验数据,利用离散AMSAA(Army Material Systems Analysis Activity)可靠性增长模型对产品可靠性的变化规律进行描述,给出了变总体试验数据似然函数的表达式,并对变总体Bayes序贯检验的后验概率比和决策阈值进行了定义,进而构建了可靠性增长下的Bayes序贯检验模型.研究结果表明,提出的方法有效地解决了具有可靠性增长的可靠性指标的假设检验问题.
