Testing-effort（TE） and imperfect debugging（ID） in the reliability modeling process may further improve the fitting and prediction results of software reliability growth models（SRGMs）. For describing the S-shaped...Testing-effort（TE） and imperfect debugging（ID） in the reliability modeling process may further improve the fitting and prediction results of software reliability growth models（SRGMs）. For describing the S-shaped varying trend of TE increasing rate more accurately, first, two S-shaped testing-effort functions（TEFs）, i.e.,delayed S-shaped TEF（DS-TEF） and inflected S-shaped TEF（IS-TEF）, are proposed. Then these two TEFs are incorporated into various types（exponential-type, delayed S-shaped and inflected S-shaped） of non-homogeneous Poisson process（NHPP）SRGMs with two forms of ID respectively for obtaining a series of new NHPP SRGMs which consider S-shaped TEFs as well as ID. Finally these new SRGMs and several comparison NHPP SRGMs are applied into four real failure data-sets respectively for investigating the fitting and prediction power of these new SRGMs.The experimental results show that：（i） the proposed IS-TEF is more suitable and flexible for describing the consumption of TE than the previous TEFs;（ii） incorporating TEFs into the inflected S-shaped NHPP SRGM may be more effective and appropriate compared with the exponential-type and the delayed S-shaped NHPP SRGMs;（iii） the inflected S-shaped NHPP SRGM considering both IS-TEF and ID yields the most accurate fitting and prediction results than the other comparison NHPP SRGMs.展开更多
As one of the most important indexes to evaluate the quality of software, software reliability experiences an increasing development in recent years. We investigate a software reliability growth model(SRGM). The appli...As one of the most important indexes to evaluate the quality of software, software reliability experiences an increasing development in recent years. We investigate a software reliability growth model(SRGM). The application of this model is to predict the occurrence of the software faults based on the non-homogeneous Poisson process(NHPP). Unlike the independent assumptions in other models, we consider fault dependency. The testing faults are divided into three classes in this model: leading faults, first-step dependent faults and second-step dependent faults. The leading faults occurring independently follow an NHPP, while the first-step dependent faults only become detectable after the related leading faults are detected. The second-step dependent faults can only be detected after the related first-step dependent faults are detected. Then, the combined model is built on the basis of the three sub-processes. Finally, an illustration based on real dataset is presented to verify the proposed model.展开更多
Masked data are the system failure data when exact component causing system failure might be unknown.In this paper,the mathematical description of general masked data was presented in software reliability engineering....Masked data are the system failure data when exact component causing system failure might be unknown.In this paper,the mathematical description of general masked data was presented in software reliability engineering.Furthermore,a general maskedbased additive non-homogeneous Poisson process(NHPP) model was considered to analyze component reliability.However,the problem of masked-based additive model lies in the difficulty of estimating parameters.The maximum likelihood estimation procedure was derived to estimate parameters.Finally,a numerical example was given to illustrate the applicability of proposed model,and the immune particle swarm optimization(IPSO) algorithm was used in maximize log-likelihood function.展开更多
Because of the inevitable debugging lag,imperfect debugging process is used to replace perfect debugging process in the analysis of software reliability growth model.Considering neither testing-effort nor testing cove...Because of the inevitable debugging lag,imperfect debugging process is used to replace perfect debugging process in the analysis of software reliability growth model.Considering neither testing-effort nor testing coverage can describe software reliability for imperfect debugging completely,by hybridizing testing-effort with testing coverage under imperfect debugging,this paper proposes a new model named GMW-LO-ID.Under the assumption that the number of faults is proportional to the current number of detected faults,this model combines generalized modified Weibull(GMW)testing-effort function with logistic(LO)testing coverage function,and inherits GMW's amazing flexibility and LO's high fitting precision.Furthermore,the fitting accuracy and predictive power are verified by two series of experiments and we can draw a conclusion that our model fits the actual failure data better and predicts the software future behavior better than other ten traditional models,which only consider one or two points of testing-effort,testing coverage and imperfect debugging.展开更多
In this paper, an improved NHPP model is proposed by replacing constant fault removal time with time-varying fault removal delay in NHPP model, proposed by Daniel R Jeske. In our model, a time-dependent delay function...In this paper, an improved NHPP model is proposed by replacing constant fault removal time with time-varying fault removal delay in NHPP model, proposed by Daniel R Jeske. In our model, a time-dependent delay function is established to fit the fault removal process. By using two sets of practical data, the descriptive and predictive abilities of the improved NHPP model are compared with those of the NHPP model, G-O model, and delayed S-shape model. The results show that the improved model can fit and predict the data better.展开更多
基金supported by the Pre-research Foundation of CPLA General Equipment Department
文摘Testing-effort（TE） and imperfect debugging（ID） in the reliability modeling process may further improve the fitting and prediction results of software reliability growth models（SRGMs）. For describing the S-shaped varying trend of TE increasing rate more accurately, first, two S-shaped testing-effort functions（TEFs）, i.e.,delayed S-shaped TEF（DS-TEF） and inflected S-shaped TEF（IS-TEF）, are proposed. Then these two TEFs are incorporated into various types（exponential-type, delayed S-shaped and inflected S-shaped） of non-homogeneous Poisson process（NHPP）SRGMs with two forms of ID respectively for obtaining a series of new NHPP SRGMs which consider S-shaped TEFs as well as ID. Finally these new SRGMs and several comparison NHPP SRGMs are applied into four real failure data-sets respectively for investigating the fitting and prediction power of these new SRGMs.The experimental results show that：（i） the proposed IS-TEF is more suitable and flexible for describing the consumption of TE than the previous TEFs;（ii） incorporating TEFs into the inflected S-shaped NHPP SRGM may be more effective and appropriate compared with the exponential-type and the delayed S-shaped NHPP SRGMs;（iii） the inflected S-shaped NHPP SRGM considering both IS-TEF and ID yields the most accurate fitting and prediction results than the other comparison NHPP SRGMs.
基金the National Natural Science Foundation of China(No.71671016)the School Fund of Beijing Information Science&Technology University(No.1935004)
文摘As one of the most important indexes to evaluate the quality of software, software reliability experiences an increasing development in recent years. We investigate a software reliability growth model(SRGM). The application of this model is to predict the occurrence of the software faults based on the non-homogeneous Poisson process(NHPP). Unlike the independent assumptions in other models, we consider fault dependency. The testing faults are divided into three classes in this model: leading faults, first-step dependent faults and second-step dependent faults. The leading faults occurring independently follow an NHPP, while the first-step dependent faults only become detectable after the related leading faults are detected. The second-step dependent faults can only be detected after the related first-step dependent faults are detected. Then, the combined model is built on the basis of the three sub-processes. Finally, an illustration based on real dataset is presented to verify the proposed model.
基金Technology Foundation of Guizhou Province,China(No.QianKeHeJZi[2015]2064)Scientific Research Foundation for Advanced Talents in Guizhou Institue of Technology and Science,China(No.XJGC20150106)Joint Foundation of Guizhou Province,China(No.QianKeHeLHZi[2015]7105)
文摘Masked data are the system failure data when exact component causing system failure might be unknown.In this paper,the mathematical description of general masked data was presented in software reliability engineering.Furthermore,a general maskedbased additive non-homogeneous Poisson process(NHPP) model was considered to analyze component reliability.However,the problem of masked-based additive model lies in the difficulty of estimating parameters.The maximum likelihood estimation procedure was derived to estimate parameters.Finally,a numerical example was given to illustrate the applicability of proposed model,and the immune particle swarm optimization(IPSO) algorithm was used in maximize log-likelihood function.
基金supported by the National Natural Science Foundation of China(No.U1433116)the Aviation Science Foundation of China(No.20145752033)
文摘Because of the inevitable debugging lag,imperfect debugging process is used to replace perfect debugging process in the analysis of software reliability growth model.Considering neither testing-effort nor testing coverage can describe software reliability for imperfect debugging completely,by hybridizing testing-effort with testing coverage under imperfect debugging,this paper proposes a new model named GMW-LO-ID.Under the assumption that the number of faults is proportional to the current number of detected faults,this model combines generalized modified Weibull(GMW)testing-effort function with logistic(LO)testing coverage function,and inherits GMW's amazing flexibility and LO's high fitting precision.Furthermore,the fitting accuracy and predictive power are verified by two series of experiments and we can draw a conclusion that our model fits the actual failure data better and predicts the software future behavior better than other ten traditional models,which only consider one or two points of testing-effort,testing coverage and imperfect debugging.
基金the National High Technology Research and Development Program of China (863 Program) under Grant No. 2006AA01Z173.
文摘In this paper, an improved NHPP model is proposed by replacing constant fault removal time with time-varying fault removal delay in NHPP model, proposed by Daniel R Jeske. In our model, a time-dependent delay function is established to fit the fault removal process. By using two sets of practical data, the descriptive and predictive abilities of the improved NHPP model are compared with those of the NHPP model, G-O model, and delayed S-shape model. The results show that the improved model can fit and predict the data better.
