A new optical microscopy technique,termed high spatial and temporal resolution synthetic aperture phase microscopy(HISTR-SAPM),is proposed to improve the lateral resolution of wide-field coherent imaging.Under plane w...A new optical microscopy technique,termed high spatial and temporal resolution synthetic aperture phase microscopy(HISTR-SAPM),is proposed to improve the lateral resolution of wide-field coherent imaging.Under plane wave illumination,the resolution is increased by twofold to around 260 nm,while achieving millisecond-level temporal resolution.In HISTR-SAPM,digital micromirror devices are used to actively change the sample illumination beam angle at high speed with high stability.An off-axis interferometer is used to measure the sample scattered complex fields,which are then processed to reconstruct high-resolution phase images.Using HISTR-SAPM,we are able to map the height profiles of subwavelength photonic structures and resolve the period structures that have 198 nm linewidth and 132 nm gap(i.e.,a full pitch of 330 nm).As the reconstruction averages out laser speckle noise while maintaining high temporal resolution,HISTR-SAPM further enables imaging and quantification of nanoscale dynamics of live cells,such as red blood cell membrane fluctuations and subcellular structure dynamics within nucleated cells.We envision that HISTR-SAPM will broadly benefit research in material science and biology.展开更多
This paper considers an optimal sequential inspection schedule for a second-hand product after that the free nonrenewable warranty is expired. The length of warranty is prespecified and during the warranty period, the...This paper considers an optimal sequential inspection schedule for a second-hand product after that the free nonrenewable warranty is expired. The length of warranty is prespecified and during the warranty period, the product is minimally repaired by the dealer when it fails. Following the expiration of the non-renewing warranty, the product is inspected and upgraded sequentially a fixed number of times at the expenses of the customer.At each inspection, the failure rate of the product is reduced proportionally so that the product is upgraded. The product is assumed to deteriorate as it ages and the replacement of the product occurs when a fixed number of inspections are rendered. In addition,the intervals between two successive inspections are assumed to decrease monotonically. The main objective of this paper is to determine the optimal improvement level to upgrade the product at each inspection so that the expected maintenance cost during the life cycle of the product is minimized from the perspective of the customer. Under the given cost structures, we derive an explicit formula to obtain the expected maintenance cost incurred during the life cycle of the product and discuss the method to find the optimal level of the improvement analytically in case the failure times follow the Weibull distribution. Numerical results are analyzed to observe the impact of relevant parameters on the optimal solution.展开更多
基金We acknowledge financial support from Hong Kong Innovation and Technology Fund(Nos.ITS/394/17 and ITS/098/18FP)Shun Hing Institute of Advanced Engineering(No.BME-p3-18)Croucher Innovation Awards 2019,and the U.S.National Institutes of Health(No.5P41EB015871-33).
文摘A new optical microscopy technique,termed high spatial and temporal resolution synthetic aperture phase microscopy(HISTR-SAPM),is proposed to improve the lateral resolution of wide-field coherent imaging.Under plane wave illumination,the resolution is increased by twofold to around 260 nm,while achieving millisecond-level temporal resolution.In HISTR-SAPM,digital micromirror devices are used to actively change the sample illumination beam angle at high speed with high stability.An off-axis interferometer is used to measure the sample scattered complex fields,which are then processed to reconstruct high-resolution phase images.Using HISTR-SAPM,we are able to map the height profiles of subwavelength photonic structures and resolve the period structures that have 198 nm linewidth and 132 nm gap(i.e.,a full pitch of 330 nm).As the reconstruction averages out laser speckle noise while maintaining high temporal resolution,HISTR-SAPM further enables imaging and quantification of nanoscale dynamics of live cells,such as red blood cell membrane fluctuations and subcellular structure dynamics within nucleated cells.We envision that HISTR-SAPM will broadly benefit research in material science and biology.
基金supported by the Research Base Construction Fund Support Program funded by Chonbuk National University in 2013the Mid-career Research Program(2016R1A2B4010080)through NRF Grant funded by MEST
文摘This paper considers an optimal sequential inspection schedule for a second-hand product after that the free nonrenewable warranty is expired. The length of warranty is prespecified and during the warranty period, the product is minimally repaired by the dealer when it fails. Following the expiration of the non-renewing warranty, the product is inspected and upgraded sequentially a fixed number of times at the expenses of the customer.At each inspection, the failure rate of the product is reduced proportionally so that the product is upgraded. The product is assumed to deteriorate as it ages and the replacement of the product occurs when a fixed number of inspections are rendered. In addition,the intervals between two successive inspections are assumed to decrease monotonically. The main objective of this paper is to determine the optimal improvement level to upgrade the product at each inspection so that the expected maintenance cost during the life cycle of the product is minimized from the perspective of the customer. Under the given cost structures, we derive an explicit formula to obtain the expected maintenance cost incurred during the life cycle of the product and discuss the method to find the optimal level of the improvement analytically in case the failure times follow the Weibull distribution. Numerical results are analyzed to observe the impact of relevant parameters on the optimal solution.
