Degradation and overstress failures occur in many electronic systems in which the operation load and environmental conditions are complex.The dependency of them called dependent competing failure process(DCFP),has bee...Degradation and overstress failures occur in many electronic systems in which the operation load and environmental conditions are complex.The dependency of them called dependent competing failure process(DCFP),has been widely studied.Electronic system may experience mutual effects of degradation and shocks,they are considered to be interdependent.Both the degradation and the shock processes will decrease the limit of system and cause cumulative effect.Finally,the competition of hard and soft failure will cause the system failure.Based on the failure mechanism accumulation theory,this paper constructs the shock-degradation acceleration and the threshold descent model,and a system reliability model established by using these two models.The mutually DCFP effect of electronic system interaction has been decomposed into physical correlation of failure,including acceleration,accumulation and competition.As a case,a reliability of electronic system in aeronautical system has been analyzed with the proposed method.The method proposed is based on failure physical evaluation,and could provide important reference for quantitative evaluation and design improvement of the newly designed system in case of data deficiency.展开更多
The mode hopping phenomenon induced by optical feedback in single-mode microchip Nd：YAG lasers is presented. With optical feedback, mode hopping strongly depends on two factors： the ratio of external cavity length t...The mode hopping phenomenon induced by optical feedback in single-mode microchip Nd：YAG lasers is presented. With optical feedback, mode hopping strongly depends on two factors： the ratio of external cavity length to intra-cavity length, and initial gains of the two hopping modes, When external cavity length equals an integral multiple of intracavity length, there is almost no mode hopping. However, if the external cavity length does not equal an integral multiple of intra-cavity length, mode hopping occurs. The ratio of external cavity length to intra-cavity length determines the position of two-mode hopping, The initial gains of the two hopping modes determine the corresponding peak values and oscillating periods of them in the intensity modulation curves.展开更多
We simulate some laser output patterns observed in our previous experiment employing superposition of Laguerre- Gaussian modes. The rotating pattern is qualitatively analysed from the point of contemporary spatial bur...We simulate some laser output patterns observed in our previous experiment employing superposition of Laguerre- Gaussian modes. The rotating pattern is qualitatively analysed from the point of contemporary spatial burning hole effect of the lasing crystal.展开更多
基金supported by the National Natural Science Foundation of China(61503014,62073009)。
文摘Degradation and overstress failures occur in many electronic systems in which the operation load and environmental conditions are complex.The dependency of them called dependent competing failure process(DCFP),has been widely studied.Electronic system may experience mutual effects of degradation and shocks,they are considered to be interdependent.Both the degradation and the shock processes will decrease the limit of system and cause cumulative effect.Finally,the competition of hard and soft failure will cause the system failure.Based on the failure mechanism accumulation theory,this paper constructs the shock-degradation acceleration and the threshold descent model,and a system reliability model established by using these two models.The mutually DCFP effect of electronic system interaction has been decomposed into physical correlation of failure,including acceleration,accumulation and competition.As a case,a reliability of electronic system in aeronautical system has been analyzed with the proposed method.The method proposed is based on failure physical evaluation,and could provide important reference for quantitative evaluation and design improvement of the newly designed system in case of data deficiency.
基金Project supported by the National Natural Science Foundation of China （Grant No 60438010）.
文摘The mode hopping phenomenon induced by optical feedback in single-mode microchip Nd：YAG lasers is presented. With optical feedback, mode hopping strongly depends on two factors： the ratio of external cavity length to intra-cavity length, and initial gains of the two hopping modes, When external cavity length equals an integral multiple of intracavity length, there is almost no mode hopping. However, if the external cavity length does not equal an integral multiple of intra-cavity length, mode hopping occurs. The ratio of external cavity length to intra-cavity length determines the position of two-mode hopping, The initial gains of the two hopping modes determine the corresponding peak values and oscillating periods of them in the intensity modulation curves.
基金Supported by the National Natural Science Foundation of China under Grant Nos 10534020 and 60478009.
文摘We simulate some laser output patterns observed in our previous experiment employing superposition of Laguerre- Gaussian modes. The rotating pattern is qualitatively analysed from the point of contemporary spatial burning hole effect of the lasing crystal.
