Low-frequency noises (LFN) and noise-like oscillations (NLO) in GaAs metal semiconductor field effect transistor (MESFET) channel current were investigated under sidegating bias conditions.It was found that the fluctu...Low-frequency noises (LFN) and noise-like oscillations (NLO) in GaAs metal semiconductor field effect transistor (MESFET) channel current were investigated under sidegating bias conditions.It was found that the fluctuations of the channel current were directly dependent upon the sidegating bias.As the sidegating bias decreased,the amplitudes of the oscillations would increase correspondingly.Furthermore,the LFN and NLO would attenuate sharply when the sidegating bias increased to more than a certain voltage.Two mechanisms are presented to demonstrate that the effective substrate resistivity or the channel-substrate junction modulated by sidegating bias and deep level traps would take responsibilities for the LFN and NLO.展开更多
Low-frequency noises in GaAs MESFET are usually observed when investigating the drain current and substrate leakage current under sidegate bias conditions. Experimental results show that the magnitude of low-frequency...Low-frequency noises in GaAs MESFET are usually observed when investigating the drain current and substrate leakage current under sidegate bias conditions. Experimental results show that the magnitude of low-frequency noises is in a direct dependency upon the sidegate bias and the noises in drain current will disappear if sidegate bias increases more negatively beyond a certain voltage. A mechanism associated with the substrate conductivity and the channel-substrate junction modulated by sidegate bias is proposed to explain the fluctuation of low-frequency noises.展开更多
Low-frequency oscillations in channel current are usually observed when measuring the GaAs MESFET’s output characteristics. This paper studies the oscillations by testing the MESFET’s output characteristics under di...Low-frequency oscillations in channel current are usually observed when measuring the GaAs MESFET’s output characteristics. This paper studies the oscillations by testing the MESFET’s output characteristics under different sidegate bias conditions. It is shown that the low-frequency oscillations of channel current are directly related to the sidegate bias. In other words, the sidegate bias can modulate the oscillations. Whether the sidegate bias varies positively or negatively, there will inevitably be a threshold voltage after which the low-frequency oscillations disappear. The observa- tion is strongly dependent upon the peculiarities of chan- nel-substrate (C-S) junction and impact ionization of traps-EL2 under high field. This conclusion is of particular pertinence to the design of low-noise GaAs IC’s.展开更多
基金Project (No.KYJD09012) supported by the Fundamental Research Funds for the Central Universities,China
文摘Low-frequency noises (LFN) and noise-like oscillations (NLO) in GaAs metal semiconductor field effect transistor (MESFET) channel current were investigated under sidegating bias conditions.It was found that the fluctuations of the channel current were directly dependent upon the sidegating bias.As the sidegating bias decreased,the amplitudes of the oscillations would increase correspondingly.Furthermore,the LFN and NLO would attenuate sharply when the sidegating bias increased to more than a certain voltage.Two mechanisms are presented to demonstrate that the effective substrate resistivity or the channel-substrate junction modulated by sidegating bias and deep level traps would take responsibilities for the LFN and NLO.
文摘Low-frequency noises in GaAs MESFET are usually observed when investigating the drain current and substrate leakage current under sidegate bias conditions. Experimental results show that the magnitude of low-frequency noises is in a direct dependency upon the sidegate bias and the noises in drain current will disappear if sidegate bias increases more negatively beyond a certain voltage. A mechanism associated with the substrate conductivity and the channel-substrate junction modulated by sidegate bias is proposed to explain the fluctuation of low-frequency noises.
文摘Low-frequency oscillations in channel current are usually observed when measuring the GaAs MESFET’s output characteristics. This paper studies the oscillations by testing the MESFET’s output characteristics under different sidegate bias conditions. It is shown that the low-frequency oscillations of channel current are directly related to the sidegate bias. In other words, the sidegate bias can modulate the oscillations. Whether the sidegate bias varies positively or negatively, there will inevitably be a threshold voltage after which the low-frequency oscillations disappear. The observa- tion is strongly dependent upon the peculiarities of chan- nel-substrate (C-S) junction and impact ionization of traps-EL2 under high field. This conclusion is of particular pertinence to the design of low-noise GaAs IC’s.
