In order to decrease the consumption of reagents and silicon during removal of surface contamination before silicon texturing in solar cell manufacturing industry, a new low-cost surface treatment approach of electroc...In order to decrease the consumption of reagents and silicon during removal of surface contamination before silicon texturing in solar cell manufacturing industry, a new low-cost surface treatment approach of electrochemical cleaning technique(ECT) is reported. In this technique, a powerful oxidizing electrolyte was obtained from the electrochemical reaction on Boron-doped Diamond(BDD) electrodes, and applied during removal of surface contaminations on silicon wafer surfaces. The slightly polished monocrystalline silicon surfaces after cleaning were compared with the ones of primal silicon wafers. The measurement results show that ECT is quite efficient in removing NaCl and organic contaminants. After cleaning, the contrast test was conducted for the textured silicon wafers with/without pre-treatment(polish) separately. The results show that the size of pyramids on the surface without traditional polishing process is homogeneous and smaller than 4μm, and the average surface reflectance is much lower in the wavelength range from 400nm to 800nm. Therefore, the new technique can save silicon material, and effectively avoid optical losses for improving photoconversion effect of solar cells.展开更多
基金National Natural Science Foundation of China(10676008)Specialized Research Fund for the Doctoral Program of Higher Education of China(20050080007)
文摘In order to decrease the consumption of reagents and silicon during removal of surface contamination before silicon texturing in solar cell manufacturing industry, a new low-cost surface treatment approach of electrochemical cleaning technique(ECT) is reported. In this technique, a powerful oxidizing electrolyte was obtained from the electrochemical reaction on Boron-doped Diamond(BDD) electrodes, and applied during removal of surface contaminations on silicon wafer surfaces. The slightly polished monocrystalline silicon surfaces after cleaning were compared with the ones of primal silicon wafers. The measurement results show that ECT is quite efficient in removing NaCl and organic contaminants. After cleaning, the contrast test was conducted for the textured silicon wafers with/without pre-treatment(polish) separately. The results show that the size of pyramids on the surface without traditional polishing process is homogeneous and smaller than 4μm, and the average surface reflectance is much lower in the wavelength range from 400nm to 800nm. Therefore, the new technique can save silicon material, and effectively avoid optical losses for improving photoconversion effect of solar cells.