通过微、宏观测试分析,研究了无碱液体速凝剂与水泥基材料的适应性及其水化促凝机理。结果表明:自制无碱液体速凝剂对实验中的三种水泥初凝时间均小于3 min 31 s,终凝时间均小于7 min 35 s表现出良好的适应性,与聚羧酸超塑化剂或萘系超...通过微、宏观测试分析,研究了无碱液体速凝剂与水泥基材料的适应性及其水化促凝机理。结果表明:自制无碱液体速凝剂对实验中的三种水泥初凝时间均小于3 min 31 s,终凝时间均小于7 min 35 s表现出良好的适应性,与聚羧酸超塑化剂或萘系超塑化剂复掺时,降低水灰比至0.32时,水泥凝结时间均可达到JC477-2005要求;通过XRD、TG/DTA与SEM分析微观结构得出,速凝剂对1～28 d的水化产物的类型基本没有影响。在掺入速凝剂的水泥-速凝剂-水体系中,速凝剂的主要成分硫酸铝与CH生成微细针柱状AFt,其主要是通过液相反应-沉淀过程形成。结晶水化产物的生长、发展,在水泥颗粒间交叉连续生成网络型结构,而加速凝结;水泥水化早期生成的CH被速凝剂消耗,且形成钙矾石加速了硅酸二钙(C_2S)、硅酸三钙(C_3S)的水化进程,使水泥快速凝结硬化。展开更多
Choosing small and medium power switching transistors of the NPN type in a 3DK set as the study object,the test of accelerating life is conducted in constant temperature and humidity,and then the data are statisticall...Choosing small and medium power switching transistors of the NPN type in a 3DK set as the study object,the test of accelerating life is conducted in constant temperature and humidity,and then the data are statistically analyzed with software developed by ourselves.According to degradations of such sensitive parameters as the reverse leakage current of transistors,the lifetime order of transistors is about more than 10^4 at 100℃and 100% relative humidity（RH） conditions.By corrosion fracture of transistor outer leads and other failure modes,with the failure truncated testing,the average lifetime rank of transistors in different distributions is extrapolated about 10^3. Failure mechanism analyses of degradation of electrical parameters,outer lead fracture and other reasons that affect transistor lifetime are conducted.The findings show that the impact of external stress of outer leads on transistor reliability is more serious than that of parameter degradation.展开更多
文摘通过微、宏观测试分析,研究了无碱液体速凝剂与水泥基材料的适应性及其水化促凝机理。结果表明:自制无碱液体速凝剂对实验中的三种水泥初凝时间均小于3 min 31 s,终凝时间均小于7 min 35 s表现出良好的适应性,与聚羧酸超塑化剂或萘系超塑化剂复掺时,降低水灰比至0.32时,水泥凝结时间均可达到JC477-2005要求;通过XRD、TG/DTA与SEM分析微观结构得出,速凝剂对1～28 d的水化产物的类型基本没有影响。在掺入速凝剂的水泥-速凝剂-水体系中,速凝剂的主要成分硫酸铝与CH生成微细针柱状AFt,其主要是通过液相反应-沉淀过程形成。结晶水化产物的生长、发展,在水泥颗粒间交叉连续生成网络型结构,而加速凝结;水泥水化早期生成的CH被速凝剂消耗,且形成钙矾石加速了硅酸二钙(C_2S)、硅酸三钙(C_3S)的水化进程,使水泥快速凝结硬化。
文摘Choosing small and medium power switching transistors of the NPN type in a 3DK set as the study object,the test of accelerating life is conducted in constant temperature and humidity,and then the data are statistically analyzed with software developed by ourselves.According to degradations of such sensitive parameters as the reverse leakage current of transistors,the lifetime order of transistors is about more than 10^4 at 100℃and 100% relative humidity（RH） conditions.By corrosion fracture of transistor outer leads and other failure modes,with the failure truncated testing,the average lifetime rank of transistors in different distributions is extrapolated about 10^3. Failure mechanism analyses of degradation of electrical parameters,outer lead fracture and other reasons that affect transistor lifetime are conducted.The findings show that the impact of external stress of outer leads on transistor reliability is more serious than that of parameter degradation.
