Scan-based design for test （DFT） is a powerful and the most popular testing technique. However, while scan-based DFT improves test efficiency, it also leaves a side channel to the privacy information stored in the c...Scan-based design for test （DFT） is a powerful and the most popular testing technique. However, while scan-based DFT improves test efficiency, it also leaves a side channel to the privacy information stored in the chip. This paper investigates the side channel and proposes a simple but powerful scan-based attack that can reveal the key and/or state stored in the chips that implement the state-of-the-art stream ciphers with less than 85 scan-out vectors.展开更多
基金partially supported by the National High Technology Research and Development 863 Program of China under Grant No.2013AA013202the Key Programs for Science and Technology Development of Chongqing of China under Grant No.cstc2012ggC40005+1 种基金the National Natural Science Foundation of China under Grant No.61173014the National Science Foundation of USA under Grant No.CNS-1015802
文摘Scan-based design for test （DFT） is a powerful and the most popular testing technique. However, while scan-based DFT improves test efficiency, it also leaves a side channel to the privacy information stored in the chip. This paper investigates the side channel and proposes a simple but powerful scan-based attack that can reveal the key and/or state stored in the chips that implement the state-of-the-art stream ciphers with less than 85 scan-out vectors.
